BUILT-IN SELF-TEST FOR LIGHT EMITTING DIODES

Embodiments of the disclosure relate to a built-in self-test for light emitting diodes. In some embodiments, a device includes a built-in self-test for detecting a fault between a first light emitting diode (LED) and a second LED. The device includes a first pair of pads configured to connect to the first LED and a second pair of pads configured to connect to the second LED. The built-in self-test is configured to control a first driver and a second driver to turn on, one-by-one, respective pass switches connected to the first and second pairs of pads. The built-in self-test is configured to then determine the first and second forward voltages across the first and second LEDs. The built-in self-test can determine whether the fault exists between the first and second LEDs based on the forward voltages. 本公开的实施例涉及针对发光二极管的内建自测试。在一些示例中，设备包括内建自测试，该内建自测试用于检测第一发光二极管(LED)和第二LED之间的故障。设备包括第一焊盘对和第二焊盘对，第一焊盘对被配置为连接至第一LED，第二焊盘对被配置为连接至第二LED。内建自测试被配置为：控制第一驱动器和第二驱动器以逐个导通连接到第一焊盘对和第二焊盘对的相应通过开关。内建自测试被配置为然后确定第一LED和第二LED两端的第一正向电压和第