BUILT-IN SELF-TEST FOR LIGHT EMITTING DIODES
Embodiments of the disclosure relate to built-in self-test for light emitting diodes. In some examples, a device includes a built-in self-test for detecting a fault on a light emitting diode (LED) or on a driver for an LED. The device includes a pair of pads that are configured to connect to the LED...
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| creator | CHIODO ROSARIO DE CICCO ADOLFO |
| description | Embodiments of the disclosure relate to built-in self-test for light emitting diodes. In some examples, a device includes a built-in self-test for detecting a fault on a light emitting diode (LED) or on a driver for an LED. The device includes a pair of pads that are configured to connect to the LED. The built-in self-test is configured to control the driver to turn on a respective pass switch connected to a pad of the pair of pads. The built-in self-test is configured to then determine a voltage level at each pad of the pair of pads. The built-in self-test can determine whether the fault exists on the LED, across the first anode pad and the first cathode pad, or on the driver based on the voltage level at each pad.
本公开的实施例涉及针对发光二极管的自建内测试。在一些示例中，设备包括用于检测发光二极管(LED)或LED的驱动器上的故障的内建自测试。设备包括被配置为连接到LED的焊盘对。内建自测试被配置为控制驱动器将与焊盘对中的焊盘连接的相应通过开关接通。内建自测试被配置为确定焊盘对中每个焊盘处的电压电平。内建自测试可以基于每个焊盘处的电压电平来确定在LED上、跨第一阳极焊盘与第一阴极焊盘、或驱动器上是否存在故障。 |
| format | Patent |
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本公开的实施例涉及针对发光二极管的自建内测试。在一些示例中，设备包括用于检测发光二极管(LED)或LED的驱动器上的故障的内建自测试。设备包括被配置为连接到LED的焊盘对。内建自测试被配置为控制驱动器将与焊盘对中的焊盘连接的相应通过开关接通。内建自测试被配置为确定焊盘对中每个焊盘处的电压电平。内建自测试可以基于每个焊盘处的电压电平来确定在LED上、跨第一阳极焊盘与第一阴极焊盘、或驱动器上是否存在故障。</description><language>chi ; eng</language><subject>ELECTRIC HEATING ; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211026&DB=EPODOC&CC=CN&NR=113552459A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211026&DB=EPODOC&CC=CN&NR=113552459A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHIODO ROSARIO</creatorcontrib><creatorcontrib>DE CICCO ADOLFO</creatorcontrib><title>BUILT-IN SELF-TEST FOR LIGHT EMITTING DIODES</title><description>Embodiments of the disclosure relate to built-in self-test for light emitting diodes. In some examples, a device includes a built-in self-test for detecting a fault on a light emitting diode (LED) or on a driver for an LED. The device includes a pair of pads that are configured to connect to the LED. The built-in self-test is configured to control the driver to turn on a respective pass switch connected to a pad of the pair of pads. The built-in self-test is configured to then determine a voltage level at each pad of the pair of pads. The built-in self-test can determine whether the fault exists on the LED, across the first anode pad and the first cathode pad, or on the driver based on the voltage level at each pad.
本公开的实施例涉及针对发光二极管的自建内测试。在一些示例中，设备包括用于检测发光二极管(LED)或LED的驱动器上的故障的内建自测试。设备包括被配置为连接到LED的焊盘对。内建自测试被配置为控制驱动器将与焊盘对中的焊盘连接的相应通过开关接通。内建自测试被配置为确定焊盘对中每个焊盘处的电压电平。内建自测试可以基于每个焊盘处的电压电平来确定在LED上、跨第一阳极焊盘与第一阴极焊盘、或驱动器上是否存在故障。</description><subject>ELECTRIC HEATING</subject><subject>ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBxCvX0CdH19FMIdvVx0w1xDQ5RcPMPUvDxdPcIUXD19QwJ8fRzV3Dx9HdxDeZhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGxqamRiamlo7GxKgBAIdvJQw</recordid><startdate>20211026</startdate><enddate>20211026</enddate><creator>CHIODO ROSARIO</creator><creator>DE CICCO ADOLFO</creator><scope>EVB</scope></search><sort><creationdate>20211026</creationdate><title>BUILT-IN SELF-TEST FOR LIGHT EMITTING DIODES</title><author>CHIODO ROSARIO ; DE CICCO ADOLFO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113552459A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>ELECTRIC HEATING</topic><topic>ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHIODO ROSARIO</creatorcontrib><creatorcontrib>DE CICCO ADOLFO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHIODO ROSARIO</au><au>DE CICCO ADOLFO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>BUILT-IN SELF-TEST FOR LIGHT EMITTING DIODES</title><date>2021-10-26</date><risdate>2021</risdate><abstract>Embodiments of the disclosure relate to built-in self-test for light emitting diodes. In some examples, a device includes a built-in self-test for detecting a fault on a light emitting diode (LED) or on a driver for an LED. The device includes a pair of pads that are configured to connect to the LED. The built-in self-test is configured to control the driver to turn on a respective pass switch connected to a pad of the pair of pads. The built-in self-test is configured to then determine a voltage level at each pad of the pair of pads. The built-in self-test can determine whether the fault exists on the LED, across the first anode pad and the first cathode pad, or on the driver based on the voltage level at each pad.
本公开的实施例涉及针对发光二极管的自建内测试。在一些示例中，设备包括用于检测发光二极管(LED)或LED的驱动器上的故障的内建自测试。设备包括被配置为连接到LED的焊盘对。内建自测试被配置为控制驱动器将与焊盘对中的焊盘连接的相应通过开关接通。内建自测试被配置为确定焊盘对中每个焊盘处的电压电平。内建自测试可以基于每个焊盘处的电压电平来确定在LED上、跨第一阳极焊盘与第一阴极焊盘、或驱动器上是否存在故障。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | ELECTRIC HEATING ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | BUILT-IN SELF-TEST FOR LIGHT EMITTING DIODES |
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