Data quality inspection method and system for digital line graph and readable storage medium
The invention discloses a data quality inspection method and system for a digital line graph and a readable storage medium. The method comprises the following steps: acquiring basic model data and vector result data; generating a plurality of pieces of data to be subjected to quality inspection base...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a data quality inspection method and system for a digital line graph and a readable storage medium. The method comprises the following steps: acquiring basic model data and vector result data; generating a plurality of pieces of data to be subjected to quality inspection based on the vector result data, wherein the data to be subjected to quality inspection are wall corner points or wall lines; performing quality inspection on each piece of data to be subjected to quality inspection, wherein the quality inspection steps are as follows: feature data corresponding to the data to be subjected to quality inspection are extracted from the basic model data, data fitting is carried out based on the feature data, and reference data corresponding to the data to be subjected to quality inspection are generated; and comparing the data to be subjected to quality inspection with corresponding reference data to generate a corresponding comparison result. At present, quality inspection is often perfo |
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