Power supply circuit for cable comprehensive test
The invention discloses a power supply circuit for a cable comprehensive test. The power supply circuit comprises a negative polarity high-voltage power supply circuit which comprises a first adjustable high-frequency alternating-current power supply, a first high-frequency high-voltage transformer,...
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| creator | KONG DEWU LIU YING LEI XIAOYUE ZHANG KUANFENG SUN TINGXI FANG YIZHI ZHAO ZUNHUI JIANG ZHIBIN CUI JIANGJING ZHENG QISHI YANG YUYAN CAI WEI LIANG YUXIONG |
| description | The invention discloses a power supply circuit for a cable comprehensive test. The power supply circuit comprises a negative polarity high-voltage power supply circuit which comprises a first adjustable high-frequency alternating-current power supply, a first high-frequency high-voltage transformer, a first resistor group, a first capacitor group, a first light-operated semiconductor switch group and a first high-voltage silicon stack group; the positive polarity high-voltage power supply circuit comprises a second adjustable high-frequency alternating-current power supply, a second high-frequency high-voltage transformer, a second resistor group, a second capacitor group, a second light-operated semiconductor switch group and a second high-voltage silicon stack group; the voltage-dividing coupling unit comprises a third resistor group and a third capacitor group; the dielectric loss measuring unit comprises a divider resistor group, a current transformer, an acquisition card and an industrial personal comput |
| format | Patent |
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The power supply circuit comprises a negative polarity high-voltage power supply circuit which comprises a first adjustable high-frequency alternating-current power supply, a first high-frequency high-voltage transformer, a first resistor group, a first capacitor group, a first light-operated semiconductor switch group and a first high-voltage silicon stack group; the positive polarity high-voltage power supply circuit comprises a second adjustable high-frequency alternating-current power supply, a second high-frequency high-voltage transformer, a second resistor group, a second capacitor group, a second light-operated semiconductor switch group and a second high-voltage silicon stack group; the voltage-dividing coupling unit comprises a third resistor group and a third capacitor group; the dielectric loss measuring unit comprises a divider resistor group, a current transformer, an acquisition card and an industrial personal comput</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210824&DB=EPODOC&CC=CN&NR=113295964A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210824&DB=EPODOC&CC=CN&NR=113295964A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KONG DEWU</creatorcontrib><creatorcontrib>LIU YING</creatorcontrib><creatorcontrib>LEI XIAOYUE</creatorcontrib><creatorcontrib>ZHANG KUANFENG</creatorcontrib><creatorcontrib>SUN TINGXI</creatorcontrib><creatorcontrib>FANG YIZHI</creatorcontrib><creatorcontrib>ZHAO ZUNHUI</creatorcontrib><creatorcontrib>JIANG ZHIBIN</creatorcontrib><creatorcontrib>CUI JIANGJING</creatorcontrib><creatorcontrib>ZHENG QISHI</creatorcontrib><creatorcontrib>YANG YUYAN</creatorcontrib><creatorcontrib>CAI WEI</creatorcontrib><creatorcontrib>LIANG YUXIONG</creatorcontrib><title>Power supply circuit for cable comprehensive test</title><description>The invention discloses a power supply circuit for a cable comprehensive test. 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The power supply circuit comprises a negative polarity high-voltage power supply circuit which comprises a first adjustable high-frequency alternating-current power supply, a first high-frequency high-voltage transformer, a first resistor group, a first capacitor group, a first light-operated semiconductor switch group and a first high-voltage silicon stack group; the positive polarity high-voltage power supply circuit comprises a second adjustable high-frequency alternating-current power supply, a second high-frequency high-voltage transformer, a second resistor group, a second capacitor group, a second light-operated semiconductor switch group and a second high-voltage silicon stack group; the voltage-dividing coupling unit comprises a third resistor group and a third capacitor group; the dielectric loss measuring unit comprises a divider resistor group, a current transformer, an acquisition card and an industrial personal comput</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Power supply circuit for cable comprehensive test |
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