TRL calibration piece adopting defected ground structure
The invention discloses a TRL calibration piece adopting a defected ground structure. The TRL calibration piece comprises a straight-through piece, a reflecting piece and a delay piece. The reference ground below the microstrip lines of the straight-through piece, the reflecting piece and the delay...
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| creator | ZHANG SHENGFENG LIU SHITOU YANG TIANYING |
| description | The invention discloses a TRL calibration piece adopting a defected ground structure. The TRL calibration piece comprises a straight-through piece, a reflecting piece and a delay piece. The reference ground below the microstrip lines of the straight-through piece, the reflecting piece and the delay piece is provided with a defected ground structure; the defected ground structure is composed of a plurality of identical grooves which are parallel to one another. By adopting the embodiment of the invention, the electromagnetic field distribution of the TRL calibration piece medium can be improved through the defected ground structure, the electrical length of the electromagnetic wave is increased, and the size of the TRL calibration piece is reduced.
本发明公开了一种采用缺陷地结构的TRL校准件，包括：直通件、反射件和延迟件；该直通件、反射件和延迟件的微带线下方的参考地上均设置有缺陷地结构；其中，该缺陷地结构由相互平行的多个相同的凹槽构成。采用本发明实施例能通过缺陷地结构提高TRL校准件介质的电磁场分布，增加电磁波的电长度，缩小TRL校准件的尺寸。 |
| format | Patent |
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本发明公开了一种采用缺陷地结构的TRL校准件，包括：直通件、反射件和延迟件；该直通件、反射件和延迟件的微带线下方的参考地上均设置有缺陷地结构；其中，该缺陷地结构由相互平行的多个相同的凹槽构成。采用本发明实施例能通过缺陷地结构提高TRL校准件介质的电磁场分布，增加电磁波的电长度，缩小TRL校准件的尺寸。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210803&DB=EPODOC&CC=CN&NR=113203877A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210803&DB=EPODOC&CC=CN&NR=113203877A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHANG SHENGFENG</creatorcontrib><creatorcontrib>LIU SHITOU</creatorcontrib><creatorcontrib>YANG TIANYING</creatorcontrib><title>TRL calibration piece adopting defected ground structure</title><description>The invention discloses a TRL calibration piece adopting a defected ground structure. The TRL calibration piece comprises a straight-through piece, a reflecting piece and a delay piece. The reference ground below the microstrip lines of the straight-through piece, the reflecting piece and the delay piece is provided with a defected ground structure; the defected ground structure is composed of a plurality of identical grooves which are parallel to one another. By adopting the embodiment of the invention, the electromagnetic field distribution of the TRL calibration piece medium can be improved through the defected ground structure, the electrical length of the electromagnetic wave is increased, and the size of the TRL calibration piece is reduced.
本发明公开了一种采用缺陷地结构的TRL校准件，包括：直通件、反射件和延迟件；该直通件、反射件和延迟件的微带线下方的参考地上均设置有缺陷地结构；其中，该缺陷地结构由相互平行的多个相同的凹槽构成。采用本发明实施例能通过缺陷地结构提高TRL校准件介质的电磁场分布，增加电磁波的电长度，缩小TRL校准件的尺寸。</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAICfJRSE7MyUwqSizJzM9TKMhMTU5VSEzJLyjJzEtXSElNS00uSU1RSC_KL81LUSguKSpNLiktSuVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGxkYGxhbm5o7GxKgBAAdsLmk</recordid><startdate>20210803</startdate><enddate>20210803</enddate><creator>ZHANG SHENGFENG</creator><creator>LIU SHITOU</creator><creator>YANG TIANYING</creator><scope>EVB</scope></search><sort><creationdate>20210803</creationdate><title>TRL calibration piece adopting defected ground structure</title><author>ZHANG SHENGFENG ; LIU SHITOU ; YANG TIANYING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113203877A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHANG SHENGFENG</creatorcontrib><creatorcontrib>LIU SHITOU</creatorcontrib><creatorcontrib>YANG TIANYING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHANG SHENGFENG</au><au>LIU SHITOU</au><au>YANG TIANYING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TRL calibration piece adopting defected ground structure</title><date>2021-08-03</date><risdate>2021</risdate><abstract>The invention discloses a TRL calibration piece adopting a defected ground structure. The TRL calibration piece comprises a straight-through piece, a reflecting piece and a delay piece. The reference ground below the microstrip lines of the straight-through piece, the reflecting piece and the delay piece is provided with a defected ground structure; the defected ground structure is composed of a plurality of identical grooves which are parallel to one another. By adopting the embodiment of the invention, the electromagnetic field distribution of the TRL calibration piece medium can be improved through the defected ground structure, the electrical length of the electromagnetic wave is increased, and the size of the TRL calibration piece is reduced.
本发明公开了一种采用缺陷地结构的TRL校准件，包括：直通件、反射件和延迟件；该直通件、反射件和延迟件的微带线下方的参考地上均设置有缺陷地结构；其中，该缺陷地结构由相互平行的多个相同的凹槽构成。采用本发明实施例能通过缺陷地结构提高TRL校准件介质的电磁场分布，增加电磁波的电长度，缩小TRL校准件的尺寸。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | TRL calibration piece adopting defected ground structure |
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