Interactive test device and apparatus with timing mechanism
A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for de...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | HALE MICHAEL JON EGAN RICHARD L DE CALLIER RHYS FERENCZY WILLIAM J |
| description | A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for determining a test device specific adjustable cut-off value that is used to ascertain whether signal from a test line in the device corresponds to a positive or negative results, irrespective of the time elapsed since placement of sample on the test device. The adjustable cut-off value renders the system relatively insensitive to incubation time of the test device, where if the incubation time is shorter or longer than needed for accuracy of a test result, the analyzer will report an invalid result, thus preventing the reporting of an incorrect (false negative or false positive) result.
描述一种包括设备和测试装置的系统。该测试装置和设备被设计用来相互作用以确定放置在该测试装置上的样品中的感兴趣的分析物的存在或不存在。所述测试装置和设备相互作用以提供计时器特征用于确定测试装置特定的可调节的截止值，该可调节的截止值用于查明来自所述装置中的测试线的信号 |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN113156107A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN113156107A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN113156107A3</originalsourceid><addsrcrecordid>eNrjZLD2zCtJLUpMLsksS1UoSS0uUUhJLctMTlVIzEtRSCwoSCxKLCktVijPLMlQKMnMzcxLV8hNTc5IzMsszuVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGxoamZoYG5o7GxKgBAMvGL58</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Interactive test device and apparatus with timing mechanism</title><source>esp@cenet</source><creator>HALE MICHAEL JON ; EGAN RICHARD L ; DE CALLIER RHYS ; FERENCZY WILLIAM J</creator><creatorcontrib>HALE MICHAEL JON ; EGAN RICHARD L ; DE CALLIER RHYS ; FERENCZY WILLIAM J</creatorcontrib><description>A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for determining a test device specific adjustable cut-off value that is used to ascertain whether signal from a test line in the device corresponds to a positive or negative results, irrespective of the time elapsed since placement of sample on the test device. The adjustable cut-off value renders the system relatively insensitive to incubation time of the test device, where if the incubation time is shorter or longer than needed for accuracy of a test result, the analyzer will report an invalid result, thus preventing the reporting of an incorrect (false negative or false positive) result.
描述一种包括设备和测试装置的系统。该测试装置和设备被设计用来相互作用以确定放置在该测试装置上的样品中的感兴趣的分析物的存在或不存在。所述测试装置和设备相互作用以提供计时器特征用于确定测试装置特定的可调节的截止值，该可调节的截止值用于查明来自所述装置中的测试线的信号</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210723&DB=EPODOC&CC=CN&NR=113156107A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210723&DB=EPODOC&CC=CN&NR=113156107A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HALE MICHAEL JON</creatorcontrib><creatorcontrib>EGAN RICHARD L</creatorcontrib><creatorcontrib>DE CALLIER RHYS</creatorcontrib><creatorcontrib>FERENCZY WILLIAM J</creatorcontrib><title>Interactive test device and apparatus with timing mechanism</title><description>A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for determining a test device specific adjustable cut-off value that is used to ascertain whether signal from a test line in the device corresponds to a positive or negative results, irrespective of the time elapsed since placement of sample on the test device. The adjustable cut-off value renders the system relatively insensitive to incubation time of the test device, where if the incubation time is shorter or longer than needed for accuracy of a test result, the analyzer will report an invalid result, thus preventing the reporting of an incorrect (false negative or false positive) result.
描述一种包括设备和测试装置的系统。该测试装置和设备被设计用来相互作用以确定放置在该测试装置上的样品中的感兴趣的分析物的存在或不存在。所述测试装置和设备相互作用以提供计时器特征用于确定测试装置特定的可调节的截止值，该可调节的截止值用于查明来自所述装置中的测试线的信号</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLD2zCtJLUpMLsksS1UoSS0uUUhJLctMTlVIzEtRSCwoSCxKLCktVijPLMlQKMnMzcxLV8hNTc5IzMsszuVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGxoamZoYG5o7GxKgBAMvGL58</recordid><startdate>20210723</startdate><enddate>20210723</enddate><creator>HALE MICHAEL JON</creator><creator>EGAN RICHARD L</creator><creator>DE CALLIER RHYS</creator><creator>FERENCZY WILLIAM J</creator><scope>EVB</scope></search><sort><creationdate>20210723</creationdate><title>Interactive test device and apparatus with timing mechanism</title><author>HALE MICHAEL JON ; EGAN RICHARD L ; DE CALLIER RHYS ; FERENCZY WILLIAM J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113156107A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HALE MICHAEL JON</creatorcontrib><creatorcontrib>EGAN RICHARD L</creatorcontrib><creatorcontrib>DE CALLIER RHYS</creatorcontrib><creatorcontrib>FERENCZY WILLIAM J</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HALE MICHAEL JON</au><au>EGAN RICHARD L</au><au>DE CALLIER RHYS</au><au>FERENCZY WILLIAM J</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Interactive test device and apparatus with timing mechanism</title><date>2021-07-23</date><risdate>2021</risdate><abstract>A system comprised of an apparatus and a test device is described. The test device and the apparatus are designed to interact to determine the presence or absence of an analyte of interest in a sample placed on the test device. The test device and apparatus interact to provide a timer feature for determining a test device specific adjustable cut-off value that is used to ascertain whether signal from a test line in the device corresponds to a positive or negative results, irrespective of the time elapsed since placement of sample on the test device. The adjustable cut-off value renders the system relatively insensitive to incubation time of the test device, where if the incubation time is shorter or longer than needed for accuracy of a test result, the analyzer will report an invalid result, thus preventing the reporting of an incorrect (false negative or false positive) result.
描述一种包括设备和测试装置的系统。该测试装置和设备被设计用来相互作用以确定放置在该测试装置上的样品中的感兴趣的分析物的存在或不存在。所述测试装置和设备相互作用以提供计时器特征用于确定测试装置特定的可调节的截止值，该可调节的截止值用于查明来自所述装置中的测试线的信号</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN113156107A |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Interactive test device and apparatus with timing mechanism |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T01%3A57%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HALE%20MICHAEL%20JON&rft.date=2021-07-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN113156107A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |