Optical film detection system and optical film detection method using same
An optical film detection system comprises a thermal detection device and a processor. The heat detection device is used for detecting heat distribution of the optical film and the environment. The processor is configured to determine a position of a film boundary of the optical film according to th...
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| creator | XUE GELIANG HUANG CHENGJIA |
| description | An optical film detection system comprises a thermal detection device and a processor. The heat detection device is used for detecting heat distribution of the optical film and the environment. The processor is configured to determine a position of a film boundary of the optical film according to the heat distribution.
光学膜检测系统包括热检测装置及处理器。热检测装置用以检测光学膜及环境的热分布。处理器用以依据热分布，判断光学膜的膜边界的位置。 |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN113155889A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN113155889A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN113155889A3</originalsourceid><addsrcrecordid>eNrjZPDyLyjJTE7MUUjLzMlVSEktSU0uyczPUyiuLC5JzVVIzEtRyMeuIje1JCM_RaG0ODMvXaE4MTeVh4E1LTGnOJUXSnMzKLq5hjh76KYW5MenFhckJqfmpZbEO_sZGhobmppaWFg6GhOjBgAp4jUu</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Optical film detection system and optical film detection method using same</title><source>esp@cenet</source><creator>XUE GELIANG ; HUANG CHENGJIA</creator><creatorcontrib>XUE GELIANG ; HUANG CHENGJIA</creatorcontrib><description>An optical film detection system comprises a thermal detection device and a processor. The heat detection device is used for detecting heat distribution of the optical film and the environment. The processor is configured to determine a position of a film boundary of the optical film according to the heat distribution.
光学膜检测系统包括热检测装置及处理器。热检测装置用以检测光学膜及环境的热分布。处理器用以依据热分布，判断光学膜的膜边界的位置。</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210723&DB=EPODOC&CC=CN&NR=113155889A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210723&DB=EPODOC&CC=CN&NR=113155889A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XUE GELIANG</creatorcontrib><creatorcontrib>HUANG CHENGJIA</creatorcontrib><title>Optical film detection system and optical film detection method using same</title><description>An optical film detection system comprises a thermal detection device and a processor. The heat detection device is used for detecting heat distribution of the optical film and the environment. The processor is configured to determine a position of a film boundary of the optical film according to the heat distribution.
光学膜检测系统包括热检测装置及处理器。热检测装置用以检测光学膜及环境的热分布。处理器用以依据热分布，判断光学膜的膜边界的位置。</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDyLyjJTE7MUUjLzMlVSEktSU0uyczPUyiuLC5JzVVIzEtRyMeuIje1JCM_RaG0ODMvXaE4MTeVh4E1LTGnOJUXSnMzKLq5hjh76KYW5MenFhckJqfmpZbEO_sZGhobmppaWFg6GhOjBgAp4jUu</recordid><startdate>20210723</startdate><enddate>20210723</enddate><creator>XUE GELIANG</creator><creator>HUANG CHENGJIA</creator><scope>EVB</scope></search><sort><creationdate>20210723</creationdate><title>Optical film detection system and optical film detection method using same</title><author>XUE GELIANG ; HUANG CHENGJIA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113155889A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>XUE GELIANG</creatorcontrib><creatorcontrib>HUANG CHENGJIA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XUE GELIANG</au><au>HUANG CHENGJIA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Optical film detection system and optical film detection method using same</title><date>2021-07-23</date><risdate>2021</risdate><abstract>An optical film detection system comprises a thermal detection device and a processor. The heat detection device is used for detecting heat distribution of the optical film and the environment. The processor is configured to determine a position of a film boundary of the optical film according to the heat distribution.
光学膜检测系统包括热检测装置及处理器。热检测装置用以检测光学膜及环境的热分布。处理器用以依据热分布，判断光学膜的膜边界的位置。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | Optical film detection system and optical film detection method using same |
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