Derrick structure deformation detection device and derrick

The embodiment of the invention discloses a derrick structure deformation detection device and a derrick. The device comprises a first supporting column, a second supporting column, a third supporting column, a fourth supporting column and a semi-transparent and semi-reflecting mirror, wherein the f...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHU KUN, YANG XIAN, WANG TAIPING, WEN XIAOMING, ZHANG ZHENHUA, ZHANG ZHUANGLING, PAN QISHEN, HUANG YANHUI, QIU DAN, WANG MINGXIN, LIU WENSONG, ZENG ZHI, ZHANG YAO, LI RUISHAN, YI BINGKUN, ZHONG WANGUO, LI KAIWEN, ZHENG SONGYUAN, ZHONG LIANG, WU WEIZHI, CHEN JIANCHENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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