Electronic component testing device and method

Electronic component testing device and method

The invention provides an electronic component testing device and an electronic component testing method. The electronic component testing method comprises the following steps: firstly, a standard signal is provided; a first current measurement value or a first voltage measurement value associated w...

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Hauptverfasser: HUANG ZHIZHONG, TONG HENGJIN, DU JIAHAO, WU JIANMING, CHEN SIFEN
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator HUANG ZHIZHONG
TONG HENGJIN
DU JIAHAO
WU JIANMING
CHEN SIFEN
description The invention provides an electronic component testing device and an electronic component testing method. The electronic component testing method comprises the following steps: firstly, a standard signal is provided; a first current measurement value or a first voltage measurement value associated with the electronic component is measured; a signal measurement value associated with the standard signal is measusred; then, the signal measurement value is compared with a default measurement value associated with the standard signal, and an error parameter is calculated thereby and the first current measurement value or the first voltage measurement value is corrected according to the error parameter so as to obtain an actual current value or an actual voltage value associated with the electronic component. 本申请提供一种电子组件测试装置与方法，所述电子组件测试方法包含下列步骤。首先，提供标准信号。并且，量测关联于电子组件的第一电流量测值或第一电压量测值。接着，量测关联于标准信号的信号量测值。接着，比对信号量测值与关联于标准信号的默认量测值，据以计算误差参数。以及，依据误差参数校正第一电流量测值或第一电压量测值，据以取得关联于电子组件的实际电流值或实际电压值。
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Electronic component testing device and method
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