WORKLOAD INSTRUMENT MASKING
A method to optimize analyzer use in a laboratory (10) having a plurality of analyzers (15) based on laboratory workload is presented. The method comprises determining current laboratory workload, calculating workload capability of the plurality of analyzers (15) minus one analyzer if the current la...
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| creator | MAETZLER MARCO |
| description | A method to optimize analyzer use in a laboratory (10) having a plurality of analyzers (15) based on laboratory workload is presented. The method comprises determining current laboratory workload, calculating workload capability of the plurality of analyzers (15) minus one analyzer if the current laboratory workload is below a threshold criteria and if there are two or more analyzers in the plurality of analyzers (15), masking one of the plurality of analyzers (15) if the current workload is met by the plurality of analyzers (15) minus one analyzer, proceeding with current workload, and repeating the above steps until the current laboratory workload has been completed.
本公开提出了一种在具有多台分析仪(15)的实验室(10)中基于实验室工作负荷而优化分析仪使用的方法。所述方法包括：确定当前的实验室工作负荷；如果所述当前的实验室工作负荷低于阈值标准并且如果所述多台分析仪(15)中有两台或更多台分析仪，则计算所述多台分析仪(15)减去一台分析仪的工作负荷能力；如果所述多台分析仪(15)减去一台分析仪满足当前的工作负荷，则掩蔽所述多台分析仪(15)中的一台分析仪；以当前的工作负荷继续进行；以及重复上述步骤直到完成所述当前的实验室工作负荷。 |
| format | Patent |
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本公开提出了一种在具有多台分析仪(15)的实验室(10)中基于实验室工作负荷而优化分析仪使用的方法。所述方法包括：确定当前的实验室工作负荷；如果所述当前的实验室工作负荷低于阈值标准并且如果所述多台分析仪(15)中有两台或更多台分析仪，则计算所述多台分析仪(15)减去一台分析仪的工作负荷能力；如果所述多台分析仪(15)减去一台分析仪满足当前的工作负荷，则掩蔽所述多台分析仪(15)中的一台分析仪；以当前的工作负荷继续进行；以及重复上述步骤直到完成所述当前的实验室工作负荷。</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210709&DB=EPODOC&CC=CN&NR=113092794A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210709&DB=EPODOC&CC=CN&NR=113092794A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MAETZLER MARCO</creatorcontrib><title>WORKLOAD INSTRUMENT MASKING</title><description>A method to optimize analyzer use in a laboratory (10) having a plurality of analyzers (15) based on laboratory workload is presented. The method comprises determining current laboratory workload, calculating workload capability of the plurality of analyzers (15) minus one analyzer if the current laboratory workload is below a threshold criteria and if there are two or more analyzers in the plurality of analyzers (15), masking one of the plurality of analyzers (15) if the current workload is met by the plurality of analyzers (15) minus one analyzer, proceeding with current workload, and repeating the above steps until the current laboratory workload has been completed.
本公开提出了一种在具有多台分析仪(15)的实验室(10)中基于实验室工作负荷而优化分析仪使用的方法。所述方法包括：确定当前的实验室工作负荷；如果所述当前的实验室工作负荷低于阈值标准并且如果所述多台分析仪(15)中有两台或更多台分析仪，则计算所述多台分析仪(15)减去一台分析仪的工作负荷能力；如果所述多台分析仪(15)减去一台分析仪满足当前的工作负荷，则掩蔽所述多台分析仪(15)中的一台分析仪；以当前的工作负荷继续进行；以及重复上述步骤直到完成所述当前的实验室工作负荷。</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAO9w_y9vF3dFHw9AsOCQr1dfULUfB1DPb29HPnYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhsYGlkbmliaOxsSoAQBuiSDQ</recordid><startdate>20210709</startdate><enddate>20210709</enddate><creator>MAETZLER MARCO</creator><scope>EVB</scope></search><sort><creationdate>20210709</creationdate><title>WORKLOAD INSTRUMENT MASKING</title><author>MAETZLER MARCO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN113092794A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MAETZLER MARCO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MAETZLER MARCO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>WORKLOAD INSTRUMENT MASKING</title><date>2021-07-09</date><risdate>2021</risdate><abstract>A method to optimize analyzer use in a laboratory (10) having a plurality of analyzers (15) based on laboratory workload is presented. The method comprises determining current laboratory workload, calculating workload capability of the plurality of analyzers (15) minus one analyzer if the current laboratory workload is below a threshold criteria and if there are two or more analyzers in the plurality of analyzers (15), masking one of the plurality of analyzers (15) if the current workload is met by the plurality of analyzers (15) minus one analyzer, proceeding with current workload, and repeating the above steps until the current laboratory workload has been completed.
本公开提出了一种在具有多台分析仪(15)的实验室(10)中基于实验室工作负荷而优化分析仪使用的方法。所述方法包括：确定当前的实验室工作负荷；如果所述当前的实验室工作负荷低于阈值标准并且如果所述多台分析仪(15)中有两台或更多台分析仪，则计算所述多台分析仪(15)减去一台分析仪的工作负荷能力；如果所述多台分析仪(15)减去一台分析仪满足当前的工作负荷，则掩蔽所述多台分析仪(15)中的一台分析仪；以当前的工作负荷继续进行；以及重复上述步骤直到完成所述当前的实验室工作负荷。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | WORKLOAD INSTRUMENT MASKING |
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