Dynamic target simulation source for measuring tracking precision of photoelectric tracking and aiming instrument

The invention belongs to the technical field of optical metrology and measurement, and particularly relates to a dynamic target simulation source for measuring the tracking precision of a photoelectric tracking and aiming instrument. The dynamic target simulation source comprises a support, a dynami...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZHANG BONI, JIANG CHANGLU, KANG DENGKUI, WANG NANQIAN, CHEN JIEJING, WANG SHENGYUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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