Process method for processing 12-inch polished silicon wafer

The invention discloses a process method for processing a 12-inch polished silicon wafer. The process method comprises the following steps of: (1) carrying out NOTCH polishing and edge polishing on a 12-inch silicon wafer of which the two sides are polished, then putting the silicon wafer into a waf...

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Hauptverfasser: CHEN HAIBIN, KU LIMING, SU BING, ZHU QINFA, YAN ZHIRUI
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creator CHEN HAIBIN
KU LIMING
SU BING
ZHU QINFA
YAN ZHIRUI
description The invention discloses a process method for processing a 12-inch polished silicon wafer. The process method comprises the following steps of: (1) carrying out NOTCH polishing and edge polishing on a 12-inch silicon wafer of which the two sides are polished, then putting the silicon wafer into a wafer box, and putting the wafer box into a normal-temperature water tank containing pure water; (2) putting the wafer box filled with the silicon wafer into a No.1 liquid for cleaning, and then putting the wafer box into a No.2 liquid for cleaning, the No.1 liquid comprising ammonia water, hydrogen peroxide and pure water according to a volume ratio of 1: 1: 5-1: 5: 10, and the No.2 liquid comprising hydrochloric acid, hydrogen peroxide and pure water according to a volume ratio of 1: 1: 5-1: 5: 10; and (3) putting the cleaned wafer box filled with the silicon wafer into a water tank filled with warm water, and then slowly lifting the wafer box upwards to achieve the purpose of drying. By adopting the process method
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN112967922A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN112967922A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN112967922A3</originalsourceid><addsrcrecordid>eNrjZLAJKMpPTi0uVshNLcnIT1FIyy9SKIAIZealKxga6WbmJWcoFOTnZBZnpKYoFGfmZCbn5ymUJ6alFvEwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0NDI0szc0sjI0djYtQAAMOxL4U</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Process method for processing 12-inch polished silicon wafer</title><source>esp@cenet</source><creator>CHEN HAIBIN ; KU LIMING ; SU BING ; ZHU QINFA ; YAN ZHIRUI</creator><creatorcontrib>CHEN HAIBIN ; KU LIMING ; SU BING ; ZHU QINFA ; YAN ZHIRUI</creatorcontrib><description>The invention discloses a process method for processing a 12-inch polished silicon wafer. The process method comprises the following steps of: (1) carrying out NOTCH polishing and edge polishing on a 12-inch silicon wafer of which the two sides are polished, then putting the silicon wafer into a wafer box, and putting the wafer box into a normal-temperature water tank containing pure water; (2) putting the wafer box filled with the silicon wafer into a No.1 liquid for cleaning, and then putting the wafer box into a No.2 liquid for cleaning, the No.1 liquid comprising ammonia water, hydrogen peroxide and pure water according to a volume ratio of 1: 1: 5-1: 5: 10, and the No.2 liquid comprising hydrochloric acid, hydrogen peroxide and pure water according to a volume ratio of 1: 1: 5-1: 5: 10; and (3) putting the cleaned wafer box filled with the silicon wafer into a water tank filled with warm water, and then slowly lifting the wafer box upwards to achieve the purpose of drying. By adopting the process method</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210615&amp;DB=EPODOC&amp;CC=CN&amp;NR=112967922A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210615&amp;DB=EPODOC&amp;CC=CN&amp;NR=112967922A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN HAIBIN</creatorcontrib><creatorcontrib>KU LIMING</creatorcontrib><creatorcontrib>SU BING</creatorcontrib><creatorcontrib>ZHU QINFA</creatorcontrib><creatorcontrib>YAN ZHIRUI</creatorcontrib><title>Process method for processing 12-inch polished silicon wafer</title><description>The invention discloses a process method for processing a 12-inch polished silicon wafer. The process method comprises the following steps of: (1) carrying out NOTCH polishing and edge polishing on a 12-inch silicon wafer of which the two sides are polished, then putting the silicon wafer into a wafer box, and putting the wafer box into a normal-temperature water tank containing pure water; (2) putting the wafer box filled with the silicon wafer into a No.1 liquid for cleaning, and then putting the wafer box into a No.2 liquid for cleaning, the No.1 liquid comprising ammonia water, hydrogen peroxide and pure water according to a volume ratio of 1: 1: 5-1: 5: 10, and the No.2 liquid comprising hydrochloric acid, hydrogen peroxide and pure water according to a volume ratio of 1: 1: 5-1: 5: 10; and (3) putting the cleaned wafer box filled with the silicon wafer into a water tank filled with warm water, and then slowly lifting the wafer box upwards to achieve the purpose of drying. By adopting the process method</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAJKMpPTi0uVshNLcnIT1FIyy9SKIAIZealKxga6WbmJWcoFOTnZBZnpKYoFGfmZCbn5ymUJ6alFvEwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0NDI0szc0sjI0djYtQAAMOxL4U</recordid><startdate>20210615</startdate><enddate>20210615</enddate><creator>CHEN HAIBIN</creator><creator>KU LIMING</creator><creator>SU BING</creator><creator>ZHU QINFA</creator><creator>YAN ZHIRUI</creator><scope>EVB</scope></search><sort><creationdate>20210615</creationdate><title>Process method for processing 12-inch polished silicon wafer</title><author>CHEN HAIBIN ; KU LIMING ; SU BING ; ZHU QINFA ; YAN ZHIRUI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN112967922A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN HAIBIN</creatorcontrib><creatorcontrib>KU LIMING</creatorcontrib><creatorcontrib>SU BING</creatorcontrib><creatorcontrib>ZHU QINFA</creatorcontrib><creatorcontrib>YAN ZHIRUI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN HAIBIN</au><au>KU LIMING</au><au>SU BING</au><au>ZHU QINFA</au><au>YAN ZHIRUI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Process method for processing 12-inch polished silicon wafer</title><date>2021-06-15</date><risdate>2021</risdate><abstract>The invention discloses a process method for processing a 12-inch polished silicon wafer. The process method comprises the following steps of: (1) carrying out NOTCH polishing and edge polishing on a 12-inch silicon wafer of which the two sides are polished, then putting the silicon wafer into a wafer box, and putting the wafer box into a normal-temperature water tank containing pure water; (2) putting the wafer box filled with the silicon wafer into a No.1 liquid for cleaning, and then putting the wafer box into a No.2 liquid for cleaning, the No.1 liquid comprising ammonia water, hydrogen peroxide and pure water according to a volume ratio of 1: 1: 5-1: 5: 10, and the No.2 liquid comprising hydrochloric acid, hydrogen peroxide and pure water according to a volume ratio of 1: 1: 5-1: 5: 10; and (3) putting the cleaned wafer box filled with the silicon wafer into a water tank filled with warm water, and then slowly lifting the wafer box upwards to achieve the purpose of drying. By adopting the process method</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title Process method for processing 12-inch polished silicon wafer
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T23%3A02%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHEN%20HAIBIN&rft.date=2021-06-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN112967922A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true