Hidden danger quality inspection method and device, electronic equipment and storage medium

The invention discloses a hidden danger quality inspection method and apparatus, electronic equipment and a storage medium. The method comprises the steps of obtaining enterprise risk data of a target enterprise and to-be-inspected data of the target enterprise; determining target quality inspection...

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Bibliographische Detailangaben
Hauptverfasser: YUAN SAI, ZHOU LIN, YIN JIYAO, LIANG XIN, CHEN WENGANG, CAO ERBIAO, YAO FANGLAI, REN YINGJUN, ZHU KAIHAO, WANG DAWEI, TAN SICHEN
Format: Patent
Sprache:chi ; eng
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