POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD
The embodiment of the invention relates to a power amplifier testing system and a related testing method. The testing system includes: a signal generator arranged to generate a testing signal; a dividing circuit coupled to the signal generator for providing a plurality of input signals according to...
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| creator | XIE XIEHONG CHEN YANZHEN LIN WUZHEN YE ZIZHEN |
| description | The embodiment of the invention relates to a power amplifier testing system and a related testing method. The testing system includes: a signal generator arranged to generate a testing signal; a dividing circuit coupled to the signal generator for providing a plurality of input signals according to the testing signal; and a plurality of power-amplifier chips coupled to the dividing circuit for being tested by generating a plurality of output signals for a predetermined testing time according to the plurality of input signals respectively.
本发明实施例涉及功率放大器测试系统及相关测试方法。一种测试系统包含：信号产生器，其经布置以产生测试信号；分配电路，其耦合到所述信号产生器并用于根据所述测试信号提供多个输入信号；及多个功率放大器芯片，其耦合到所述分配电路并用于通过分别根据所述多个输入信号在预定测试时间产生多个输出信号而进行测试。 |
| format | Patent |
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本发明实施例涉及功率放大器测试系统及相关测试方法。一种测试系统包含：信号产生器，其经布置以产生测试信号；分配电路，其耦合到所述信号产生器并用于根据所述测试信号提供多个输入信号；及多个功率放大器芯片，其耦合到所述分配电路并用于通过分别根据所述多个输入信号在预定测试时间产生多个输出信号而进行测试。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210504&DB=EPODOC&CC=CN&NR=112748297A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210504&DB=EPODOC&CC=CN&NR=112748297A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>XIE XIEHONG</creatorcontrib><creatorcontrib>CHEN YANZHEN</creatorcontrib><creatorcontrib>LIN WUZHEN</creatorcontrib><creatorcontrib>YE ZIZHEN</creatorcontrib><title>POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD</title><description>The embodiment of the invention relates to a power amplifier testing system and a related testing method. The testing system includes: a signal generator arranged to generate a testing signal; a dividing circuit coupled to the signal generator for providing a plurality of input signals according to the testing signal; and a plurality of power-amplifier chips coupled to the dividing circuit for being tested by generating a plurality of output signals for a predetermined testing time according to the plurality of input signals respectively.
本发明实施例涉及功率放大器测试系统及相关测试方法。一种测试系统包含：信号产生器，其经布置以产生测试信号；分配电路，其耦合到所述信号产生器并用于根据所述测试信号提供多个输入信号；及多个功率放大器芯片，其耦合到所述分配电路并用于通过分别根据所述多个输入信号在预定测试时间产生多个输出信号而进行测试。</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAK8A93DVJw9A3w8XTzdA0KVghxDQ7x9HNXCI4MDnH1VXD0c1EIcvVxDHF1gUv5uoZ4-LvwMLCmJeYUp_JCaW4GRTfXEGcP3dSC_PjU4oLE5NS81JJ4Zz9DQyNzEwsjS3NHY2LUAADOuSlC</recordid><startdate>20210504</startdate><enddate>20210504</enddate><creator>XIE XIEHONG</creator><creator>CHEN YANZHEN</creator><creator>LIN WUZHEN</creator><creator>YE ZIZHEN</creator><scope>EVB</scope></search><sort><creationdate>20210504</creationdate><title>POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD</title><author>XIE XIEHONG ; CHEN YANZHEN ; LIN WUZHEN ; YE ZIZHEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN112748297A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>XIE XIEHONG</creatorcontrib><creatorcontrib>CHEN YANZHEN</creatorcontrib><creatorcontrib>LIN WUZHEN</creatorcontrib><creatorcontrib>YE ZIZHEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>XIE XIEHONG</au><au>CHEN YANZHEN</au><au>LIN WUZHEN</au><au>YE ZIZHEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD</title><date>2021-05-04</date><risdate>2021</risdate><abstract>The embodiment of the invention relates to a power amplifier testing system and a related testing method. The testing system includes: a signal generator arranged to generate a testing signal; a dividing circuit coupled to the signal generator for providing a plurality of input signals according to the testing signal; and a plurality of power-amplifier chips coupled to the dividing circuit for being tested by generating a plurality of output signals for a predetermined testing time according to the plurality of input signals respectively.
本发明实施例涉及功率放大器测试系统及相关测试方法。一种测试系统包含：信号产生器，其经布置以产生测试信号；分配电路，其耦合到所述信号产生器并用于根据所述测试信号提供多个输入信号；及多个功率放大器芯片，其耦合到所述分配电路并用于通过分别根据所述多个输入信号在预定测试时间产生多个输出信号而进行测试。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD |
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