Full-automatic low-temperature instrument with fixing device

The invention relates to the technical field of low-temperature instruments, in particular to a full-automatic low-temperature instrument with a fixing device, which comprises a shell, a sample grid, a lifting mechanism and a fixing mechanism, and a low-temperature box is fixedly connected to the in...

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Hauptverfasser: CHU SHANDONG, WANG HAIRONG, LU FANGFANG, MAO KUNYU, CHEN JIAHAO, YE XIANHUAI
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creator CHU SHANDONG
WANG HAIRONG
LU FANGFANG
MAO KUNYU
CHEN JIAHAO
YE XIANHUAI
description The invention relates to the technical field of low-temperature instruments, in particular to a full-automatic low-temperature instrument with a fixing device, which comprises a shell, a sample grid, a lifting mechanism and a fixing mechanism, and a low-temperature box is fixedly connected to the inner side wall of the top end of the shell; A sealing mechanism is arranged in the low-temperature box; the sample grid is fixedly connected to the top end of the lifting mechanism; the fixing mechanism is mounted in the sample grid; the lifting mechanism is installed in the shell and comprises an electric push rod, a straight rod and a hinge rod; the electric push rod is fixedly connected to the inner side wall of the bottom end of the shell; the straight rod is fixedly connected to the outer side wall of the electric push rod; one end of the hinge rod is hinged with the straight rod, and the other end is hinged with the sealing mechanism; and samples in the sample grid are kept orderly through the fixing mechanism
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN112629992A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN112629992A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN112629992A3</originalsourceid><addsrcrecordid>eNrjZLBxK83J0U0sLcnPTSzJTFbIyS_XLUnNLUgtSiwpLUpVyMwrLikqzU3NK1EozyzJUEjLrMjMS1dISS3LTE7lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhkZmRpaWlkaOxsSoAQA_fDCT</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Full-automatic low-temperature instrument with fixing device</title><source>esp@cenet</source><creator>CHU SHANDONG ; WANG HAIRONG ; LU FANGFANG ; MAO KUNYU ; CHEN JIAHAO ; YE XIANHUAI</creator><creatorcontrib>CHU SHANDONG ; WANG HAIRONG ; LU FANGFANG ; MAO KUNYU ; CHEN JIAHAO ; YE XIANHUAI</creatorcontrib><description>The invention relates to the technical field of low-temperature instruments, in particular to a full-automatic low-temperature instrument with a fixing device, which comprises a shell, a sample grid, a lifting mechanism and a fixing mechanism, and a low-temperature box is fixedly connected to the inner side wall of the top end of the shell; A sealing mechanism is arranged in the low-temperature box; the sample grid is fixedly connected to the top end of the lifting mechanism; the fixing mechanism is mounted in the sample grid; the lifting mechanism is installed in the shell and comprises an electric push rod, a straight rod and a hinge rod; the electric push rod is fixedly connected to the inner side wall of the bottom end of the shell; the straight rod is fixedly connected to the outer side wall of the electric push rod; one end of the hinge rod is hinged with the straight rod, and the other end is hinged with the sealing mechanism; and samples in the sample grid are kept orderly through the fixing mechanism</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210409&amp;DB=EPODOC&amp;CC=CN&amp;NR=112629992A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210409&amp;DB=EPODOC&amp;CC=CN&amp;NR=112629992A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHU SHANDONG</creatorcontrib><creatorcontrib>WANG HAIRONG</creatorcontrib><creatorcontrib>LU FANGFANG</creatorcontrib><creatorcontrib>MAO KUNYU</creatorcontrib><creatorcontrib>CHEN JIAHAO</creatorcontrib><creatorcontrib>YE XIANHUAI</creatorcontrib><title>Full-automatic low-temperature instrument with fixing device</title><description>The invention relates to the technical field of low-temperature instruments, in particular to a full-automatic low-temperature instrument with a fixing device, which comprises a shell, a sample grid, a lifting mechanism and a fixing mechanism, and a low-temperature box is fixedly connected to the inner side wall of the top end of the shell; A sealing mechanism is arranged in the low-temperature box; the sample grid is fixedly connected to the top end of the lifting mechanism; the fixing mechanism is mounted in the sample grid; the lifting mechanism is installed in the shell and comprises an electric push rod, a straight rod and a hinge rod; the electric push rod is fixedly connected to the inner side wall of the bottom end of the shell; the straight rod is fixedly connected to the outer side wall of the electric push rod; one end of the hinge rod is hinged with the straight rod, and the other end is hinged with the sealing mechanism; and samples in the sample grid are kept orderly through the fixing mechanism</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLBxK83J0U0sLcnPTSzJTFbIyS_XLUnNLUgtSiwpLUpVyMwrLikqzU3NK1EozyzJUEjLrMjMS1dISS3LTE7lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhkZmRpaWlkaOxsSoAQA_fDCT</recordid><startdate>20210409</startdate><enddate>20210409</enddate><creator>CHU SHANDONG</creator><creator>WANG HAIRONG</creator><creator>LU FANGFANG</creator><creator>MAO KUNYU</creator><creator>CHEN JIAHAO</creator><creator>YE XIANHUAI</creator><scope>EVB</scope></search><sort><creationdate>20210409</creationdate><title>Full-automatic low-temperature instrument with fixing device</title><author>CHU SHANDONG ; WANG HAIRONG ; LU FANGFANG ; MAO KUNYU ; CHEN JIAHAO ; YE XIANHUAI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN112629992A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHU SHANDONG</creatorcontrib><creatorcontrib>WANG HAIRONG</creatorcontrib><creatorcontrib>LU FANGFANG</creatorcontrib><creatorcontrib>MAO KUNYU</creatorcontrib><creatorcontrib>CHEN JIAHAO</creatorcontrib><creatorcontrib>YE XIANHUAI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHU SHANDONG</au><au>WANG HAIRONG</au><au>LU FANGFANG</au><au>MAO KUNYU</au><au>CHEN JIAHAO</au><au>YE XIANHUAI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Full-automatic low-temperature instrument with fixing device</title><date>2021-04-09</date><risdate>2021</risdate><abstract>The invention relates to the technical field of low-temperature instruments, in particular to a full-automatic low-temperature instrument with a fixing device, which comprises a shell, a sample grid, a lifting mechanism and a fixing mechanism, and a low-temperature box is fixedly connected to the inner side wall of the top end of the shell; A sealing mechanism is arranged in the low-temperature box; the sample grid is fixedly connected to the top end of the lifting mechanism; the fixing mechanism is mounted in the sample grid; the lifting mechanism is installed in the shell and comprises an electric push rod, a straight rod and a hinge rod; the electric push rod is fixedly connected to the inner side wall of the bottom end of the shell; the straight rod is fixedly connected to the outer side wall of the electric push rod; one end of the hinge rod is hinged with the straight rod, and the other end is hinged with the sealing mechanism; and samples in the sample grid are kept orderly through the fixing mechanism</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Full-automatic low-temperature instrument with fixing device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T20%3A11%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHU%20SHANDONG&rft.date=2021-04-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN112629992A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true