Position adjustment parameter determination method and device, electronic equipment and storage medium

Based on the position adjustment parameter determination method and device, the electronic equipment and the storage medium. The determination method comprises acquiring the feature map that comprises a first frame and a feature point set in the first frame, the first frame has a preset thickness, w...

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Hauptverfasser: MEI XUE, GUO YONGGANG, CHEN SAIHU
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Sprache:chi ; eng
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creator MEI XUE
GUO YONGGANG
CHEN SAIHU
description Based on the position adjustment parameter determination method and device, the electronic equipment and the storage medium. The determination method comprises acquiring the feature map that comprises a first frame and a feature point set in the first frame, the first frame has a preset thickness, wherein the feature point set has a preset thickness, and the feature points in the feature point set are located on different thickness planes of the first frame. determining a second frame matched with the first frame in the electronic map, determining the feature points of the corresponding points of the feature points in the second frame as first feature points, and determining the feature points, except the first feature points, in the feature point set as second feature points on different thickness planes of the first frame; determining the distance between the feature point and the plane of the second frame; and determining a current position adjustment parameter according to the distance corresponding to th
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN112629546A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN112629546A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN112629546A3</originalsourceid><addsrcrecordid>eNqNi7sOgkAURGksjPoPa68FqCSWhmisjIU9udkd8Br24e7F7xeIH2Azk8ycM8-au08s7J0i8-qTWDhRgSJZCKIyY1p2NCHD9vRGkTPD8WGNjUIHLdE71grvnsPkj0ASH6nF4Bju7TKbNdQlrH69yNaX86O6bhF8jRRIw0Hq6pbnRVkcD_vytPuH-QL76UB2</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Position adjustment parameter determination method and device, electronic equipment and storage medium</title><source>esp@cenet</source><creator>MEI XUE ; GUO YONGGANG ; CHEN SAIHU</creator><creatorcontrib>MEI XUE ; GUO YONGGANG ; CHEN SAIHU</creatorcontrib><description>Based on the position adjustment parameter determination method and device, the electronic equipment and the storage medium. The determination method comprises acquiring the feature map that comprises a first frame and a feature point set in the first frame, the first frame has a preset thickness, wherein the feature point set has a preset thickness, and the feature points in the feature point set are located on different thickness planes of the first frame. determining a second frame matched with the first frame in the electronic map, determining the feature points of the corresponding points of the feature points in the second frame as first feature points, and determining the feature points, except the first feature points, in the feature point set as second feature points on different thickness planes of the first frame; determining the distance between the feature point and the plane of the second frame; and determining a current position adjustment parameter according to the distance corresponding to th</description><language>chi ; eng</language><subject>GYROSCOPIC INSTRUMENTS ; MEASURING ; MEASURING DISTANCES, LEVELS OR BEARINGS ; NAVIGATION ; PHOTOGRAMMETRY OR VIDEOGRAMMETRY ; PHYSICS ; SURVEYING ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210409&amp;DB=EPODOC&amp;CC=CN&amp;NR=112629546A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210409&amp;DB=EPODOC&amp;CC=CN&amp;NR=112629546A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MEI XUE</creatorcontrib><creatorcontrib>GUO YONGGANG</creatorcontrib><creatorcontrib>CHEN SAIHU</creatorcontrib><title>Position adjustment parameter determination method and device, electronic equipment and storage medium</title><description>Based on the position adjustment parameter determination method and device, the electronic equipment and the storage medium. The determination method comprises acquiring the feature map that comprises a first frame and a feature point set in the first frame, the first frame has a preset thickness, wherein the feature point set has a preset thickness, and the feature points in the feature point set are located on different thickness planes of the first frame. determining a second frame matched with the first frame in the electronic map, determining the feature points of the corresponding points of the feature points in the second frame as first feature points, and determining the feature points, except the first feature points, in the feature point set as second feature points on different thickness planes of the first frame; determining the distance between the feature point and the plane of the second frame; and determining a current position adjustment parameter according to the distance corresponding to th</description><subject>GYROSCOPIC INSTRUMENTS</subject><subject>MEASURING</subject><subject>MEASURING DISTANCES, LEVELS OR BEARINGS</subject><subject>NAVIGATION</subject><subject>PHOTOGRAMMETRY OR VIDEOGRAMMETRY</subject><subject>PHYSICS</subject><subject>SURVEYING</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi7sOgkAURGksjPoPa68FqCSWhmisjIU9udkd8Br24e7F7xeIH2Azk8ycM8-au08s7J0i8-qTWDhRgSJZCKIyY1p2NCHD9vRGkTPD8WGNjUIHLdE71grvnsPkj0ASH6nF4Bju7TKbNdQlrH69yNaX86O6bhF8jRRIw0Hq6pbnRVkcD_vytPuH-QL76UB2</recordid><startdate>20210409</startdate><enddate>20210409</enddate><creator>MEI XUE</creator><creator>GUO YONGGANG</creator><creator>CHEN SAIHU</creator><scope>EVB</scope></search><sort><creationdate>20210409</creationdate><title>Position adjustment parameter determination method and device, electronic equipment and storage medium</title><author>MEI XUE ; GUO YONGGANG ; CHEN SAIHU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN112629546A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>GYROSCOPIC INSTRUMENTS</topic><topic>MEASURING</topic><topic>MEASURING DISTANCES, LEVELS OR BEARINGS</topic><topic>NAVIGATION</topic><topic>PHOTOGRAMMETRY OR VIDEOGRAMMETRY</topic><topic>PHYSICS</topic><topic>SURVEYING</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MEI XUE</creatorcontrib><creatorcontrib>GUO YONGGANG</creatorcontrib><creatorcontrib>CHEN SAIHU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MEI XUE</au><au>GUO YONGGANG</au><au>CHEN SAIHU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Position adjustment parameter determination method and device, electronic equipment and storage medium</title><date>2021-04-09</date><risdate>2021</risdate><abstract>Based on the position adjustment parameter determination method and device, the electronic equipment and the storage medium. The determination method comprises acquiring the feature map that comprises a first frame and a feature point set in the first frame, the first frame has a preset thickness, wherein the feature point set has a preset thickness, and the feature points in the feature point set are located on different thickness planes of the first frame. determining a second frame matched with the first frame in the electronic map, determining the feature points of the corresponding points of the feature points in the second frame as first feature points, and determining the feature points, except the first feature points, in the feature point set as second feature points on different thickness planes of the first frame; determining the distance between the feature point and the plane of the second frame; and determining a current position adjustment parameter according to the distance corresponding to th</abstract><oa>free_for_read</oa></addata></record>
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subjects GYROSCOPIC INSTRUMENTS
MEASURING
MEASURING DISTANCES, LEVELS OR BEARINGS
NAVIGATION
PHOTOGRAMMETRY OR VIDEOGRAMMETRY
PHYSICS
SURVEYING
TESTING
title Position adjustment parameter determination method and device, electronic equipment and storage medium
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T17%3A24%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MEI%20XUE&rft.date=2021-04-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN112629546A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true