Chip testing method and device, processor chip and server
The embodiment of the invention discloses a chip testing method and device, a processor chip and a server. The chip testing method comprises the steps of: acquiring test voltage configuration information of the chip and the initial working frequency of the chip in the test from the server, wherein t...
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| creator | MA YUE XU HONGSI LI YUFEI |
| description | The embodiment of the invention discloses a chip testing method and device, a processor chip and a server. The chip testing method comprises the steps of: acquiring test voltage configuration information of the chip and the initial working frequency of the chip in the test from the server, wherein the test voltage configuration information comprises a test voltage value for testing the chip each time; increasing the working frequency of the chip on the basis of the initial working frequency under the test voltage of the test according to the test voltage configuration information, testing thechip, and determining the highest working frequency of the chip under the test voltage of the test; increasing the working frequency of the chip on the basis of the highest working frequency obtainedby the previous test under the test voltage of the next test according to the test voltage configuration information, testing the chip, and determining the highest working frequency of the chip underthe test voltage of the nex |
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The chip testing method comprises the steps of: acquiring test voltage configuration information of the chip and the initial working frequency of the chip in the test from the server, wherein the test voltage configuration information comprises a test voltage value for testing the chip each time; increasing the working frequency of the chip on the basis of the initial working frequency under the test voltage of the test according to the test voltage configuration information, testing thechip, and determining the highest working frequency of the chip under the test voltage of the test; increasing the working frequency of the chip on the basis of the highest working frequency obtainedby the previous test under the test voltage of the next test according to the test voltage configuration information, testing the chip, and determining the highest working frequency of the chip underthe test voltage of the nex</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210319&DB=EPODOC&CC=CN&NR=112526319A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210319&DB=EPODOC&CC=CN&NR=112526319A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MA YUE</creatorcontrib><creatorcontrib>XU HONGSI</creatorcontrib><creatorcontrib>LI YUFEI</creatorcontrib><title>Chip testing method and device, processor chip and server</title><description>The embodiment of the invention discloses a chip testing method and device, a processor chip and a server. The chip testing method comprises the steps of: acquiring test voltage configuration information of the chip and the initial working frequency of the chip in the test from the server, wherein the test voltage configuration information comprises a test voltage value for testing the chip each time; increasing the working frequency of the chip on the basis of the initial working frequency under the test voltage of the test according to the test voltage configuration information, testing thechip, and determining the highest working frequency of the chip under the test voltage of the test; increasing the working frequency of the chip on the basis of the highest working frequency obtainedby the previous test under the test voltage of the next test according to the test voltage configuration information, testing the chip, and determining the highest working frequency of the chip underthe test voltage of the nex</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB0zsgsUChJLS7JzEtXyE0tychPUUjMS1FISS3LTE7VUSgoyk9OLS7OL1JIBqkESRWnFpWlFvEwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0NDI1MjM2NDS0djYtQAAA0WLjw</recordid><startdate>20210319</startdate><enddate>20210319</enddate><creator>MA YUE</creator><creator>XU HONGSI</creator><creator>LI YUFEI</creator><scope>EVB</scope></search><sort><creationdate>20210319</creationdate><title>Chip testing method and device, processor chip and server</title><author>MA YUE ; XU HONGSI ; LI YUFEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN112526319A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MA YUE</creatorcontrib><creatorcontrib>XU HONGSI</creatorcontrib><creatorcontrib>LI YUFEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MA YUE</au><au>XU HONGSI</au><au>LI YUFEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Chip testing method and device, processor chip and server</title><date>2021-03-19</date><risdate>2021</risdate><abstract>The embodiment of the invention discloses a chip testing method and device, a processor chip and a server. 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| language | chi ; eng |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Chip testing method and device, processor chip and server |
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