PLASMA PROCESSING DEVICE AND PLASMA PROCESSING METHOD
Embodiments relate to a plasma processing device and a plasma processing method. A plasma processing device according to one embodiment includes an upper electrode located in a processing chamber; a board that is located in the processing chamber, opposing the upper electrode, and includes a lower e...
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creator | KAWASAKI DAICHI |
description | Embodiments relate to a plasma processing device and a plasma processing method. A plasma processing device according to one embodiment includes an upper electrode located in a processing chamber; a board that is located in the processing chamber, opposing the upper electrode, and includes a lower electrode, and on which an intended substrate is placed; a radio-frequency power feeder that suppliesradio frequency power in-between the upper electrode and the lower electrode; a dummy ring that surrounds an annular periphery of the intended substrate located on the board; and a cooler that coolsthe dummy ring from a location away from the intended substrate in a boundary region between the dummy ring and the intended substrate.
实施方式涉及一种等离子体处理装置及等离子体处理方法。实施方式的等离子体处理装置具备配置在处理室的上部电极、载置台、高频供电部、虚设环、及冷却部。载置台在处理室内与上部电极对向配置,具有下部电极,且载置晶片。高频供电部对下部电极与上部电极之间供给高频电力。虚设环为包围载置在载置台的晶片的环状周缘部的环状部件。在虚设环与晶片的交界区域中,从自晶片离开的方向侧由冷却部将虚设环冷却。 |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN112331545A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN112331545A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN112331545A3</originalsourceid><addsrcrecordid>eNrjZDAN8HEM9nVUCAjyd3YNDvb0c1dwcQ3zdHZVcPRzUcCU9HUN8fB34WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoZGxsaGpiamjsbEqAEA5ckniA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PLASMA PROCESSING DEVICE AND PLASMA PROCESSING METHOD</title><source>esp@cenet</source><creator>KAWASAKI DAICHI</creator><creatorcontrib>KAWASAKI DAICHI</creatorcontrib><description>Embodiments relate to a plasma processing device and a plasma processing method. A plasma processing device according to one embodiment includes an upper electrode located in a processing chamber; a board that is located in the processing chamber, opposing the upper electrode, and includes a lower electrode, and on which an intended substrate is placed; a radio-frequency power feeder that suppliesradio frequency power in-between the upper electrode and the lower electrode; a dummy ring that surrounds an annular periphery of the intended substrate located on the board; and a cooler that coolsthe dummy ring from a location away from the intended substrate in a boundary region between the dummy ring and the intended substrate.
实施方式涉及一种等离子体处理装置及等离子体处理方法。实施方式的等离子体处理装置具备配置在处理室的上部电极、载置台、高频供电部、虚设环、及冷却部。载置台在处理室内与上部电极对向配置,具有下部电极,且载置晶片。高频供电部对下部电极与上部电极之间供给高频电力。虚设环为包围载置在载置台的晶片的环状周缘部的环状部件。在虚设环与晶片的交界区域中,从自晶片离开的方向侧由冷却部将虚设环冷却。</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; PLASMA TECHNIQUE ; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS ; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS ; SEMICONDUCTOR DEVICES</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210205&DB=EPODOC&CC=CN&NR=112331545A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210205&DB=EPODOC&CC=CN&NR=112331545A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KAWASAKI DAICHI</creatorcontrib><title>PLASMA PROCESSING DEVICE AND PLASMA PROCESSING METHOD</title><description>Embodiments relate to a plasma processing device and a plasma processing method. A plasma processing device according to one embodiment includes an upper electrode located in a processing chamber; a board that is located in the processing chamber, opposing the upper electrode, and includes a lower electrode, and on which an intended substrate is placed; a radio-frequency power feeder that suppliesradio frequency power in-between the upper electrode and the lower electrode; a dummy ring that surrounds an annular periphery of the intended substrate located on the board; and a cooler that coolsthe dummy ring from a location away from the intended substrate in a boundary region between the dummy ring and the intended substrate.
实施方式涉及一种等离子体处理装置及等离子体处理方法。实施方式的等离子体处理装置具备配置在处理室的上部电极、载置台、高频供电部、虚设环、及冷却部。载置台在处理室内与上部电极对向配置,具有下部电极,且载置晶片。高频供电部对下部电极与上部电极之间供给高频电力。虚设环为包围载置在载置台的晶片的环状周缘部的环状部件。在虚设环与晶片的交界区域中,从自晶片离开的方向侧由冷却部将虚设环冷却。</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>PLASMA TECHNIQUE</subject><subject>PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS</subject><subject>PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAN8HEM9nVUCAjyd3YNDvb0c1dwcQ3zdHZVcPRzUcCU9HUN8fB34WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoZGxsaGpiamjsbEqAEA5ckniA</recordid><startdate>20210205</startdate><enddate>20210205</enddate><creator>KAWASAKI DAICHI</creator><scope>EVB</scope></search><sort><creationdate>20210205</creationdate><title>PLASMA PROCESSING DEVICE AND PLASMA PROCESSING METHOD</title><author>KAWASAKI DAICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN112331545A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>PLASMA TECHNIQUE</topic><topic>PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS</topic><topic>PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>KAWASAKI DAICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KAWASAKI DAICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PLASMA PROCESSING DEVICE AND PLASMA PROCESSING METHOD</title><date>2021-02-05</date><risdate>2021</risdate><abstract>Embodiments relate to a plasma processing device and a plasma processing method. A plasma processing device according to one embodiment includes an upper electrode located in a processing chamber; a board that is located in the processing chamber, opposing the upper electrode, and includes a lower electrode, and on which an intended substrate is placed; a radio-frequency power feeder that suppliesradio frequency power in-between the upper electrode and the lower electrode; a dummy ring that surrounds an annular periphery of the intended substrate located on the board; and a cooler that coolsthe dummy ring from a location away from the intended substrate in a boundary region between the dummy ring and the intended substrate.
实施方式涉及一种等离子体处理装置及等离子体处理方法。实施方式的等离子体处理装置具备配置在处理室的上部电极、载置台、高频供电部、虚设环、及冷却部。载置台在处理室内与上部电极对向配置,具有下部电极,且载置晶片。高频供电部对下部电极与上部电极之间供给高频电力。虚设环为包围载置在载置台的晶片的环状周缘部的环状部件。在虚设环与晶片的交界区域中,从自晶片离开的方向侧由冷却部将虚设环冷却。</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY PLASMA TECHNIQUE PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS SEMICONDUCTOR DEVICES |
title | PLASMA PROCESSING DEVICE AND PLASMA PROCESSING METHOD |
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