Parameter determination method and device and electronic equipment

Parameter determination method and device and electronic equipment

The invention discloses a parameter determination method and device and electronic equipment, and the method comprises the steps: constructing a first quality function expansion QFD matrix corresponding to a first software version based on a first vector of a second demand document corresponding to...

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Hauptverfasser: HUANG DAYI, ZHANG HAO
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator HUANG DAYI
ZHANG HAO
description The invention discloses a parameter determination method and device and electronic equipment, and the method comprises the steps: constructing a first quality function expansion QFD matrix corresponding to a first software version based on a first vector of a second demand document corresponding to at least one first demand document of the first software version; determining a second QFD matrix corresponding to the first software version based on a second QFD matrix of a second demand document corresponding to the at least one first demand document; determining a first parameter of the first software version based on a first QFD matrix corresponding to the first software version and a second QFD matrix corresponding to the first software version; wherein the first parameter represents theinfluence degree of the first software version on a software system; wherein the similarity between the second demand document and the corresponding first demand document meets a historical requirement file with a preset cond
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN112306459A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN112306459A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN112306459A3</originalsourceid><addsrcrecordid>eNrjZHAKSCxKzE0tSS1SSAGRuZl5iSWZ-XkKQLGM_BSFxLwUoERZZnIqmJmak5pcUpSfl5mskFpYmlmQm5pXwsPAmpaYU5zKC6W5GRTdXEOcPXRTC_LjU4sLEpNT81JL4p39DA2NjA3MTEwtHY2JUQMAb_oycg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Parameter determination method and device and electronic equipment</title><source>esp@cenet</source><creator>HUANG DAYI ; ZHANG HAO</creator><creatorcontrib>HUANG DAYI ; ZHANG HAO</creatorcontrib><description>The invention discloses a parameter determination method and device and electronic equipment, and the method comprises the steps: constructing a first quality function expansion QFD matrix corresponding to a first software version based on a first vector of a second demand document corresponding to at least one first demand document of the first software version; determining a second QFD matrix corresponding to the first software version based on a second QFD matrix of a second demand document corresponding to the at least one first demand document; determining a first parameter of the first software version based on a first QFD matrix corresponding to the first software version and a second QFD matrix corresponding to the first software version; wherein the first parameter represents theinfluence degree of the first software version on a software system; wherein the similarity between the second demand document and the corresponding first demand document meets a historical requirement file with a preset cond</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210202&amp;DB=EPODOC&amp;CC=CN&amp;NR=112306459A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210202&amp;DB=EPODOC&amp;CC=CN&amp;NR=112306459A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HUANG DAYI</creatorcontrib><creatorcontrib>ZHANG HAO</creatorcontrib><title>Parameter determination method and device and electronic equipment</title><description>The invention discloses a parameter determination method and device and electronic equipment, and the method comprises the steps: constructing a first quality function expansion QFD matrix corresponding to a first software version based on a first vector of a second demand document corresponding to at least one first demand document of the first software version; determining a second QFD matrix corresponding to the first software version based on a second QFD matrix of a second demand document corresponding to the at least one first demand document; determining a first parameter of the first software version based on a first QFD matrix corresponding to the first software version and a second QFD matrix corresponding to the first software version; wherein the first parameter represents theinfluence degree of the first software version on a software system; wherein the similarity between the second demand document and the corresponding first demand document meets a historical requirement file with a preset cond</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAKSCxKzE0tSS1SSAGRuZl5iSWZ-XkKQLGM_BSFxLwUoERZZnIqmJmak5pcUpSfl5mskFpYmlmQm5pXwsPAmpaYU5zKC6W5GRTdXEOcPXRTC_LjU4sLEpNT81JL4p39DA2NjA3MTEwtHY2JUQMAb_oycg</recordid><startdate>20210202</startdate><enddate>20210202</enddate><creator>HUANG DAYI</creator><creator>ZHANG HAO</creator><scope>EVB</scope></search><sort><creationdate>20210202</creationdate><title>Parameter determination method and device and electronic equipment</title><author>HUANG DAYI ; ZHANG HAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN112306459A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>HUANG DAYI</creatorcontrib><creatorcontrib>ZHANG HAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HUANG DAYI</au><au>ZHANG HAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Parameter determination method and device and electronic equipment</title><date>2021-02-02</date><risdate>2021</risdate><abstract>The invention discloses a parameter determination method and device and electronic equipment, and the method comprises the steps: constructing a first quality function expansion QFD matrix corresponding to a first software version based on a first vector of a second demand document corresponding to at least one first demand document of the first software version; determining a second QFD matrix corresponding to the first software version based on a second QFD matrix of a second demand document corresponding to the at least one first demand document; determining a first parameter of the first software version based on a first QFD matrix corresponding to the first software version and a second QFD matrix corresponding to the first software version; wherein the first parameter represents theinfluence degree of the first software version on a software system; wherein the similarity between the second demand document and the corresponding first demand document meets a historical requirement file with a preset cond</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title Parameter determination method and device and electronic equipment
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T01%3A02%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HUANG%20DAYI&rft.date=2021-02-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN112306459A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true