DETECTION DEVICE
This detection device is provided with: a housing (10); a circuit substrate (20) disposed in the housing; a sensor (30) for detecting information of a measurement object, the sensor (30) being electrically connected to the circuit substrate; a connector terminal (24) formed integrally with the circu...
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| creator | HIEI MASAKI TSUJI ICHIRO |
| description | This detection device is provided with: a housing (10); a circuit substrate (20) disposed in the housing; a sensor (30) for detecting information of a measurement object, the sensor (30) being electrically connected to the circuit substrate; a connector terminal (24) formed integrally with the circuit substrate and electrically connected to an external terminal; and a cylindrical connector (11h) formed integrally with the housing, and surrounding the periphery of the connector terminal and being fitted with the external connector. Through this configuration, it is possible to achieve a reduction in the number of components, reduced cost and weight, simplification of structure, and other effects.
本发明的检测装置包括：罩壳(10)；电路基板(20)，配置于罩壳内；传感器(30)，电连接于电路基板，对测定对象物的信息进行检测；连接器端子(24)，一体地形成于电路基板，与外部端子电连接；以及筒状的连接器(11h)，一体地形成于罩壳，围绕连接器端子的周围并且嵌合于外部连接器。由此，可达成零件数的削减、低成本化、轻量化、结构的简化等。 |
| format | Patent |
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本发明的检测装置包括：罩壳(10)；电路基板(20)，配置于罩壳内；传感器(30)，电连接于电路基板，对测定对象物的信息进行检测；连接器端子(24)，一体地形成于电路基板，与外部端子电连接；以及筒状的连接器(11h)，一体地形成于罩壳，围绕连接器端子的周围并且嵌合于外部连接器。由此，可达成零件数的削减、低成本化、轻量化、结构的简化等。</description><language>chi ; eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; BASIC ELECTRIC ELEMENTS ; CURRENT COLLECTORS ; ELECTRICITY ; LINE CONNECTORS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210108&DB=EPODOC&CC=CN&NR=112204356A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210108&DB=EPODOC&CC=CN&NR=112204356A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIEI MASAKI</creatorcontrib><creatorcontrib>TSUJI ICHIRO</creatorcontrib><title>DETECTION DEVICE</title><description>This detection device is provided with: a housing (10); a circuit substrate (20) disposed in the housing; a sensor (30) for detecting information of a measurement object, the sensor (30) being electrically connected to the circuit substrate; a connector terminal (24) formed integrally with the circuit substrate and electrically connected to an external terminal; and a cylindrical connector (11h) formed integrally with the housing, and surrounding the periphery of the connector terminal and being fitted with the external connector. Through this configuration, it is possible to achieve a reduction in the number of components, reduced cost and weight, simplification of structure, and other effects.
本发明的检测装置包括：罩壳(10)；电路基板(20)，配置于罩壳内；传感器(30)，电连接于电路基板，对测定对象物的信息进行检测；连接器端子(24)，一体地形成于电路基板，与外部端子电连接；以及筒状的连接器(11h)，一体地形成于罩壳，围绕连接器端子的周围并且嵌合于外部连接器。由此，可达成零件数的削减、低成本化、轻量化、结构的简化等。</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CURRENT COLLECTORS</subject><subject>ELECTRICITY</subject><subject>LINE CONNECTORS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBBwcQ1xdQ7x9PdTcHEN83R25WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoZGRgYmxqZmjsbEqAEA-FMdVg</recordid><startdate>20210108</startdate><enddate>20210108</enddate><creator>HIEI MASAKI</creator><creator>TSUJI ICHIRO</creator><scope>EVB</scope></search><sort><creationdate>20210108</creationdate><title>DETECTION DEVICE</title><author>HIEI MASAKI ; TSUJI ICHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN112204356A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2021</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CURRENT COLLECTORS</topic><topic>ELECTRICITY</topic><topic>LINE CONNECTORS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HIEI MASAKI</creatorcontrib><creatorcontrib>TSUJI ICHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIEI MASAKI</au><au>TSUJI ICHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DETECTION DEVICE</title><date>2021-01-08</date><risdate>2021</risdate><abstract>This detection device is provided with: a housing (10); a circuit substrate (20) disposed in the housing; a sensor (30) for detecting information of a measurement object, the sensor (30) being electrically connected to the circuit substrate; a connector terminal (24) formed integrally with the circuit substrate and electrically connected to an external terminal; and a cylindrical connector (11h) formed integrally with the housing, and surrounding the periphery of the connector terminal and being fitted with the external connector. Through this configuration, it is possible to achieve a reduction in the number of components, reduced cost and weight, simplification of structure, and other effects.
本发明的检测装置包括：罩壳(10)；电路基板(20)，配置于罩壳内；传感器(30)，电连接于电路基板，对测定对象物的信息进行检测；连接器端子(24)，一体地形成于电路基板，与外部端子电连接；以及筒状的连接器(11h)，一体地形成于罩壳，围绕连接器端子的周围并且嵌合于外部连接器。由此，可达成零件数的削减、低成本化、轻量化、结构的简化等。</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY LINE CONNECTORS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | DETECTION DEVICE |
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