High-low temperature impact test device

The invention discloses a high-low temperature impact test device, which comprises a test cabinet body, a high-temperature chamber, a low-temperature chamber, a lifting mechanism, a sealing mechanism,a rapid heating mechanism and a rapid cooling mechanism; the high-temperature chamber is located at...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	MA QITIAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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