Three-dimensional surface shape measurement method and system based on speckle embedded stripes

The invention discloses a three-dimensional surface shape measurement method and system based on speckle embedded stripes. The method comprises the steps: collecting a composite phase shift stripe graph of a measured object, wherein the composite phase shift fringe pattern is an N-step phase shift f...

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Hauptverfasser:	ZHANG JIALING, GUO WENBO, DENG BINQUAN, ZENG JIYONG, ZENG HAOJIE, ZHANG QICAN, WU ZHOUJIE, GONG LIZONG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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creator	ZHANG JIALING GUO WENBO DENG BINQUAN ZENG JIYONG ZENG HAOJIE ZHANG QICAN WU ZHOUJIE GONG LIZONG
description	The invention discloses a three-dimensional surface shape measurement method and system based on speckle embedded stripes. The method comprises the steps: collecting a composite phase shift stripe graph of a measured object, wherein the composite phase shift fringe pattern is an N-step phase shift fringe pattern in which speckles are embedded in a phase domain; calculating the truncation phase ofthe composite phase shift fringe pattern of the measured object; demodulating the composite phase shift fringe pattern to obtain a corresponding deformation speckle pattern; obtaining a plurality of alternative height values according to the obtained truncation phase; finding a corresponding reference speckle pattern according to the plurality of alternative height values; and carrying out correlation operation on the reference speckle pattern and the deformed speckle pattern, carrying out screening according to a correlation operation result to obtain an actual height value, and carrying outreconstructing according t
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subjects	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
title	Three-dimensional surface shape measurement method and system based on speckle embedded stripes
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