Measuring device

The invention provides a measuring device, which comprises a positioning column and a measuring assembly; two measuring mechanisms of the measuring assembly rotatably sleeve the peripheral side of thepositioning column, each measuring mechanism comprises a sliding arm group, the sliding arm group is...

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Hauptverfasser:	CHEN JIAWEI, LIU WEI, LIU CHANGSHENG, LIU PING, LONG YUFU, GUO MENG, DU ZHENGFENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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creator	CHEN JIAWEI LIU WEI LIU CHANGSHENG LIU PING LONG YUFU GUO MENG DU ZHENGFENG
description	The invention provides a measuring device, which comprises a positioning column and a measuring assembly; two measuring mechanisms of the measuring assembly rotatably sleeve the peripheral side of thepositioning column, each measuring mechanism comprises a sliding arm group, the sliding arm group is movably arranged along the tangential direction of the positioning column, and the sliding arm group has a storage position and an extension position; when each sliding arm set is located at the extending position, the first stopping end of one sliding arm set of the two sliding arm sets abuts against a first to-be-measured object, the second stopping end of the sliding arm set abuts against a second to-be-measured object, and the first stopping end of the other sliding arm set of the two sliding arm sets abuts against a third to-be-measured object, and the second stop end of the sliding arm group abuts against the fourth to-be-measured object. According to the invention, the problem of tedious measurement procedu
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According to the invention, the problem of tedious measurement procedu</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201117&DB=EPODOC&CC=CN&NR=111947543A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201117&DB=EPODOC&CC=CN&NR=111947543A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN JIAWEI</creatorcontrib><creatorcontrib>LIU WEI</creatorcontrib><creatorcontrib>LIU CHANGSHENG</creatorcontrib><creatorcontrib>LIU PING</creatorcontrib><creatorcontrib>LONG YUFU</creatorcontrib><creatorcontrib>GUO MENG</creatorcontrib><creatorcontrib>DU ZHENGFENG</creatorcontrib><title>Measuring device</title><description>The invention provides a measuring device, which comprises a positioning column and a measuring assembly; two measuring mechanisms of the measuring assembly rotatably sleeve the peripheral side of thepositioning column, each measuring mechanism comprises a sliding arm group, the sliding arm group is movably arranged along the tangential direction of the positioning column, and the sliding arm group has a storage position and an extension position; when each sliding arm set is located at the extending position, the first stopping end of one sliding arm set of the two sliding arm sets abuts against a first to-be-measured object, the second stopping end of the sliding arm set abuts against a second to-be-measured object, and the first stopping end of the other sliding arm set of the two sliding arm sets abuts against a third to-be-measured object, and the second stop end of the sliding arm group abuts against the fourth to-be-measured object. According to the invention, the problem of tedious measurement procedu</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBDwTU0sLi3KzEtXSEkty0xO5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoaGlibmpibGjsbEqAEAp58fOA</recordid><startdate>20201117</startdate><enddate>20201117</enddate><creator>CHEN JIAWEI</creator><creator>LIU WEI</creator><creator>LIU CHANGSHENG</creator><creator>LIU PING</creator><creator>LONG YUFU</creator><creator>GUO MENG</creator><creator>DU ZHENGFENG</creator><scope>EVB</scope></search><sort><creationdate>20201117</creationdate><title>Measuring device</title><author>CHEN JIAWEI ; LIU WEI ; LIU CHANGSHENG ; LIU PING ; LONG YUFU ; GUO MENG ; DU ZHENGFENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN111947543A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN JIAWEI</creatorcontrib><creatorcontrib>LIU WEI</creatorcontrib><creatorcontrib>LIU CHANGSHENG</creatorcontrib><creatorcontrib>LIU PING</creatorcontrib><creatorcontrib>LONG YUFU</creatorcontrib><creatorcontrib>GUO MENG</creatorcontrib><creatorcontrib>DU ZHENGFENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN JIAWEI</au><au>LIU WEI</au><au>LIU CHANGSHENG</au><au>LIU PING</au><au>LONG YUFU</au><au>GUO MENG</au><au>DU ZHENGFENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Measuring device</title><date>2020-11-17</date><risdate>2020</risdate><abstract>The invention provides a measuring device, which comprises a positioning column and a measuring assembly; two measuring mechanisms of the measuring assembly rotatably sleeve the peripheral side of thepositioning column, each measuring mechanism comprises a sliding arm group, the sliding arm group is movably arranged along the tangential direction of the positioning column, and the sliding arm group has a storage position and an extension position; when each sliding arm set is located at the extending position, the first stopping end of one sliding arm set of the two sliding arm sets abuts against a first to-be-measured object, the second stopping end of the sliding arm set abuts against a second to-be-measured object, and the first stopping end of the other sliding arm set of the two sliding arm sets abuts against a third to-be-measured object, and the second stop end of the sliding arm group abuts against the fourth to-be-measured object. According to the invention, the problem of tedious measurement procedu</abstract><oa>free_for_read</oa></addata></record>
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language	chi ; eng
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subjects	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
title	Measuring device
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