Secondary circuit calibration device

The invention discloses a secondary circuit calibration device, which comprises a control unit, a key unit, a detection unit, a display unit, a switch unit and a signal conversion unit; the key unit is connected with the control unit, the key unit is used for generating a test control instruction, t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LIU BIN, LING QIANG, YANG SHIHAO, WANG QIUYU, XIE YONGXIANG, ZHUANG BOMING, ZENG HUIJUAN, SU YIMIN, ZHANG YUANYAN, CHEN LIN, LIN FULIN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator LIU BIN
LING QIANG
YANG SHIHAO
WANG QIUYU
XIE YONGXIANG
ZHUANG BOMING
ZENG HUIJUAN
SU YIMIN
ZHANG YUANYAN
CHEN LIN
LIN FULIN
description The invention discloses a secondary circuit calibration device, which comprises a control unit, a key unit, a detection unit, a display unit, a switch unit and a signal conversion unit; the key unit is connected with the control unit, the key unit is used for generating a test control instruction, the calibration device is configured with a wiring port, and a signal end of the detection unit is connected with the wiring port; the calibration device is connected in series in a circuit to be tested through a wiring port, the detection unit is further connected with the signal conversion unit through the switch unit, the control unit is connected with the switch unit, the signal conversion unit and the display unit, and the control unit is configured to determine the test duration according to a received test control instruction, controls the switch unit to be switched on during the test duration, receives the detection data sent by the signal conversion unit, controls the display unit todisplay the detection da
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN111880038A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN111880038A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN111880038A3</originalsourceid><addsrcrecordid>eNrjZFAJTk3Oz0tJLKpUSM4sSi7NLFFITszJTCpKLMnMz1NISS3LTE7lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhoYWFgYGxhaOxsSoAQAmlSb6</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Secondary circuit calibration device</title><source>esp@cenet</source><creator>LIU BIN ; LING QIANG ; YANG SHIHAO ; WANG QIUYU ; XIE YONGXIANG ; ZHUANG BOMING ; ZENG HUIJUAN ; SU YIMIN ; ZHANG YUANYAN ; CHEN LIN ; LIN FULIN</creator><creatorcontrib>LIU BIN ; LING QIANG ; YANG SHIHAO ; WANG QIUYU ; XIE YONGXIANG ; ZHUANG BOMING ; ZENG HUIJUAN ; SU YIMIN ; ZHANG YUANYAN ; CHEN LIN ; LIN FULIN</creatorcontrib><description>The invention discloses a secondary circuit calibration device, which comprises a control unit, a key unit, a detection unit, a display unit, a switch unit and a signal conversion unit; the key unit is connected with the control unit, the key unit is used for generating a test control instruction, the calibration device is configured with a wiring port, and a signal end of the detection unit is connected with the wiring port; the calibration device is connected in series in a circuit to be tested through a wiring port, the detection unit is further connected with the signal conversion unit through the switch unit, the control unit is connected with the switch unit, the signal conversion unit and the display unit, and the control unit is configured to determine the test duration according to a received test control instruction, controls the switch unit to be switched on during the test duration, receives the detection data sent by the signal conversion unit, controls the display unit todisplay the detection da</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201103&amp;DB=EPODOC&amp;CC=CN&amp;NR=111880038A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201103&amp;DB=EPODOC&amp;CC=CN&amp;NR=111880038A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIU BIN</creatorcontrib><creatorcontrib>LING QIANG</creatorcontrib><creatorcontrib>YANG SHIHAO</creatorcontrib><creatorcontrib>WANG QIUYU</creatorcontrib><creatorcontrib>XIE YONGXIANG</creatorcontrib><creatorcontrib>ZHUANG BOMING</creatorcontrib><creatorcontrib>ZENG HUIJUAN</creatorcontrib><creatorcontrib>SU YIMIN</creatorcontrib><creatorcontrib>ZHANG YUANYAN</creatorcontrib><creatorcontrib>CHEN LIN</creatorcontrib><creatorcontrib>LIN FULIN</creatorcontrib><title>Secondary circuit calibration device</title><description>The invention discloses a secondary circuit calibration device, which comprises a control unit, a key unit, a detection unit, a display unit, a switch unit and a signal conversion unit; the key unit is connected with the control unit, the key unit is used for generating a test control instruction, the calibration device is configured with a wiring port, and a signal end of the detection unit is connected with the wiring port; the calibration device is connected in series in a circuit to be tested through a wiring port, the detection unit is further connected with the signal conversion unit through the switch unit, the control unit is connected with the switch unit, the signal conversion unit and the display unit, and the control unit is configured to determine the test duration according to a received test control instruction, controls the switch unit to be switched on during the test duration, receives the detection data sent by the signal conversion unit, controls the display unit todisplay the detection da</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAJTk3Oz0tJLKpUSM4sSi7NLFFITszJTCpKLMnMz1NISS3LTE7lYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhoYWFgYGxhaOxsSoAQAmlSb6</recordid><startdate>20201103</startdate><enddate>20201103</enddate><creator>LIU BIN</creator><creator>LING QIANG</creator><creator>YANG SHIHAO</creator><creator>WANG QIUYU</creator><creator>XIE YONGXIANG</creator><creator>ZHUANG BOMING</creator><creator>ZENG HUIJUAN</creator><creator>SU YIMIN</creator><creator>ZHANG YUANYAN</creator><creator>CHEN LIN</creator><creator>LIN FULIN</creator><scope>EVB</scope></search><sort><creationdate>20201103</creationdate><title>Secondary circuit calibration device</title><author>LIU BIN ; LING QIANG ; YANG SHIHAO ; WANG QIUYU ; XIE YONGXIANG ; ZHUANG BOMING ; ZENG HUIJUAN ; SU YIMIN ; ZHANG YUANYAN ; CHEN LIN ; LIN FULIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN111880038A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LIU BIN</creatorcontrib><creatorcontrib>LING QIANG</creatorcontrib><creatorcontrib>YANG SHIHAO</creatorcontrib><creatorcontrib>WANG QIUYU</creatorcontrib><creatorcontrib>XIE YONGXIANG</creatorcontrib><creatorcontrib>ZHUANG BOMING</creatorcontrib><creatorcontrib>ZENG HUIJUAN</creatorcontrib><creatorcontrib>SU YIMIN</creatorcontrib><creatorcontrib>ZHANG YUANYAN</creatorcontrib><creatorcontrib>CHEN LIN</creatorcontrib><creatorcontrib>LIN FULIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIU BIN</au><au>LING QIANG</au><au>YANG SHIHAO</au><au>WANG QIUYU</au><au>XIE YONGXIANG</au><au>ZHUANG BOMING</au><au>ZENG HUIJUAN</au><au>SU YIMIN</au><au>ZHANG YUANYAN</au><au>CHEN LIN</au><au>LIN FULIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Secondary circuit calibration device</title><date>2020-11-03</date><risdate>2020</risdate><abstract>The invention discloses a secondary circuit calibration device, which comprises a control unit, a key unit, a detection unit, a display unit, a switch unit and a signal conversion unit; the key unit is connected with the control unit, the key unit is used for generating a test control instruction, the calibration device is configured with a wiring port, and a signal end of the detection unit is connected with the wiring port; the calibration device is connected in series in a circuit to be tested through a wiring port, the detection unit is further connected with the signal conversion unit through the switch unit, the control unit is connected with the switch unit, the signal conversion unit and the display unit, and the control unit is configured to determine the test duration according to a received test control instruction, controls the switch unit to be switched on during the test duration, receives the detection data sent by the signal conversion unit, controls the display unit todisplay the detection da</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN111880038A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Secondary circuit calibration device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T02%3A21%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LIU%20BIN&rft.date=2020-11-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN111880038A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true