Method for determining indium content in indium-containing material such as residual target by EDTA titration method

The invention relates to a method for determining the content of indium in a residual target by an EDTA titration method. In the presence of a large amount of tin and interference elements such as bismuth, iron, copper, zinc and lead, tartaric acid and glacial acetic acid are used as masking agents,...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MA CHAONING, YAO YUAN, GUO PENG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator MA CHAONING
YAO YUAN
GUO PENG
description The invention relates to a method for determining the content of indium in a residual target by an EDTA titration method. In the presence of a large amount of tin and interference elements such as bismuth, iron, copper, zinc and lead, tartaric acid and glacial acetic acid are used as masking agents, the pH is controlled to be 3 with an ammonia water solution, the temperature is controlled to be 50-80 DEG C, the influence of the interference elements on an end point is eliminated, and the content of indium in a residual target is determined with an EDTA titration method. The method is simple and easy to operate, the precision and result accuracy of the detection method are good, the method is quite suitable for detecting the indium content in the residual target, the cost is low, expensiveequipment is not needed, a large amount of detection equipment does not need to be purchased additionally, and an accurate result can be obtained through one-time analysis regardless of the indium content of a sample. 本发明涉及一种
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN111796053A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN111796053A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN111796053A3</originalsourceid><addsrcrecordid>eNqNjTEOgkAQRWksjHqH8QAkEqKGkiDGRit6MrIDTMLOkt2h8PaicgCrn_fykr-O9E7aOwOt82BIyVsWlg5YDE8WGidKojMuJv4Y_DUW555xgDA1PWAAT4HNNAtF35HC8wXlpcpBWT0qOwH7fdtGqxaHQLtlN9H-WlbFLabR1RRGbEhI6-KRJMk5Ox2OaZ7-07wBjeREvg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for determining indium content in indium-containing material such as residual target by EDTA titration method</title><source>esp@cenet</source><creator>MA CHAONING ; YAO YUAN ; GUO PENG</creator><creatorcontrib>MA CHAONING ; YAO YUAN ; GUO PENG</creatorcontrib><description>The invention relates to a method for determining the content of indium in a residual target by an EDTA titration method. In the presence of a large amount of tin and interference elements such as bismuth, iron, copper, zinc and lead, tartaric acid and glacial acetic acid are used as masking agents, the pH is controlled to be 3 with an ammonia water solution, the temperature is controlled to be 50-80 DEG C, the influence of the interference elements on an end point is eliminated, and the content of indium in a residual target is determined with an EDTA titration method. The method is simple and easy to operate, the precision and result accuracy of the detection method are good, the method is quite suitable for detecting the indium content in the residual target, the cost is low, expensiveequipment is not needed, a large amount of detection equipment does not need to be purchased additionally, and an accurate result can be obtained through one-time analysis regardless of the indium content of a sample. 本发明涉及一种</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201020&amp;DB=EPODOC&amp;CC=CN&amp;NR=111796053A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201020&amp;DB=EPODOC&amp;CC=CN&amp;NR=111796053A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MA CHAONING</creatorcontrib><creatorcontrib>YAO YUAN</creatorcontrib><creatorcontrib>GUO PENG</creatorcontrib><title>Method for determining indium content in indium-containing material such as residual target by EDTA titration method</title><description>The invention relates to a method for determining the content of indium in a residual target by an EDTA titration method. In the presence of a large amount of tin and interference elements such as bismuth, iron, copper, zinc and lead, tartaric acid and glacial acetic acid are used as masking agents, the pH is controlled to be 3 with an ammonia water solution, the temperature is controlled to be 50-80 DEG C, the influence of the interference elements on an end point is eliminated, and the content of indium in a residual target is determined with an EDTA titration method. The method is simple and easy to operate, the precision and result accuracy of the detection method are good, the method is quite suitable for detecting the indium content in the residual target, the cost is low, expensiveequipment is not needed, a large amount of detection equipment does not need to be purchased additionally, and an accurate result can be obtained through one-time analysis regardless of the indium content of a sample. 本发明涉及一种</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjTEOgkAQRWksjHqH8QAkEqKGkiDGRit6MrIDTMLOkt2h8PaicgCrn_fykr-O9E7aOwOt82BIyVsWlg5YDE8WGidKojMuJv4Y_DUW555xgDA1PWAAT4HNNAtF35HC8wXlpcpBWT0qOwH7fdtGqxaHQLtlN9H-WlbFLabR1RRGbEhI6-KRJMk5Ox2OaZ7-07wBjeREvg</recordid><startdate>20201020</startdate><enddate>20201020</enddate><creator>MA CHAONING</creator><creator>YAO YUAN</creator><creator>GUO PENG</creator><scope>EVB</scope></search><sort><creationdate>20201020</creationdate><title>Method for determining indium content in indium-containing material such as residual target by EDTA titration method</title><author>MA CHAONING ; YAO YUAN ; GUO PENG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN111796053A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MA CHAONING</creatorcontrib><creatorcontrib>YAO YUAN</creatorcontrib><creatorcontrib>GUO PENG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MA CHAONING</au><au>YAO YUAN</au><au>GUO PENG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for determining indium content in indium-containing material such as residual target by EDTA titration method</title><date>2020-10-20</date><risdate>2020</risdate><abstract>The invention relates to a method for determining the content of indium in a residual target by an EDTA titration method. In the presence of a large amount of tin and interference elements such as bismuth, iron, copper, zinc and lead, tartaric acid and glacial acetic acid are used as masking agents, the pH is controlled to be 3 with an ammonia water solution, the temperature is controlled to be 50-80 DEG C, the influence of the interference elements on an end point is eliminated, and the content of indium in a residual target is determined with an EDTA titration method. The method is simple and easy to operate, the precision and result accuracy of the detection method are good, the method is quite suitable for detecting the indium content in the residual target, the cost is low, expensiveequipment is not needed, a large amount of detection equipment does not need to be purchased additionally, and an accurate result can be obtained through one-time analysis regardless of the indium content of a sample. 本发明涉及一种</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN111796053A
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Method for determining indium content in indium-containing material such as residual target by EDTA titration method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T10%3A18%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MA%20CHAONING&rft.date=2020-10-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN111796053A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true