Test circuit and chip
The invention discloses a test circuit and a chip. The test circuit comprises a system unit and a test unit. A control module sends test information to a transmission module through a transceiver module; a processing module receives the test information through the transmission module, calls a compo...
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| creator | DU ZHANKUN LYU XUNHONG |
| description | The invention discloses a test circuit and a chip. The test circuit comprises a system unit and a test unit. A control module sends test information to a transmission module through a transceiver module; a processing module receives the test information through the transmission module, calls a component library module and a logic library module to generate an analog circuit, calls the test moduleto test the analog circuit to obtain an analog test result, and feeds back the analog test result to the control module through the transmission module; and when it is determined that the simulation test result is normal, the to-be-tested chip is connected through the test circuit, and the chip is tested according to the test information. The control module is connected with a chip to be tested through a test circuit, the universality of the chip test is improved through cooperation, the analog circuit is generated through cooperation, and simulation can be performed before the test so that the chip is protected befor |
| format | Patent |
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A control module sends test information to a transmission module through a transceiver module; a processing module receives the test information through the transmission module, calls a component library module and a logic library module to generate an analog circuit, calls the test moduleto test the analog circuit to obtain an analog test result, and feeds back the analog test result to the control module through the transmission module; and when it is determined that the simulation test result is normal, the to-be-tested chip is connected through the test circuit, and the chip is tested according to the test information. 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| language | chi ; eng |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | Test circuit and chip |
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