Method of detecting TEC abnormity of seismic ionized layer
The invention discloses a method for detecting TEC abnormity of a seismic ionized layer, and the method comprises the steps: firstly carrying out the smoothing of an original TEC observation value through Savitzky-Golay filtering, then carrying out the subtraction of the observation value and a smoo...
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creator | ZHAI DULIN ZHU FUYING QING YUN LIN JIAN |
description | The invention discloses a method for detecting TEC abnormity of a seismic ionized layer, and the method comprises the steps: firstly carrying out the smoothing of an original TEC observation value through Savitzky-Golay filtering, then carrying out the subtraction of the observation value and a smooth value of TEC, and obtaining a residual error which is disturbance. The method is simple and rapidin calculation; the method is simple in operation and obvious in effect, Savitzky-Golay filtering is innovatively used for detecting the anomaly of the ionized layer TEC, the distribution characteristics such as the relative maximum value, the minimum value and the width of the ionized layer TEC are reserved, interference of daily fluctuation is reduced, and the reliability of a detection resultis greatly improved.
本发明公开了一种检测地震电离层TEC异常的方法,其步骤为:首先是采用Savitzky-Golay滤波对原始TEC观测值进行平滑处理,然后将TEC的观测值和平滑值做差,所得残差即为扰动。本发明方法计算简单快速,效果明显,创新性地利用Savitzky-Golay滤波进行电离层TEC的异常检测,该方法保留了电离层TEC的相对极大值、极小值和宽度等分布特性,减少了日常波动的干扰,大幅提高了检测结果的可靠性。 |
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本发明公开了一种检测地震电离层TEC异常的方法,其步骤为:首先是采用Savitzky-Golay滤波对原始TEC观测值进行平滑处理,然后将TEC的观测值和平滑值做差,所得残差即为扰动。本发明方法计算简单快速,效果明显,创新性地利用Savitzky-Golay滤波进行电离层TEC的异常检测,该方法保留了电离层TEC的相对极大值、极小值和宽度等分布特性,减少了日常波动的干扰,大幅提高了检测结果的可靠性。</description><language>chi ; eng</language><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200925&DB=EPODOC&CC=CN&NR=111708075A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200925&DB=EPODOC&CC=CN&NR=111708075A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHAI DULIN</creatorcontrib><creatorcontrib>ZHU FUYING</creatorcontrib><creatorcontrib>QING YUN</creatorcontrib><creatorcontrib>LIN JIAN</creatorcontrib><title>Method of detecting TEC abnormity of seismic ionized layer</title><description>The invention discloses a method for detecting TEC abnormity of a seismic ionized layer, and the method comprises the steps: firstly carrying out the smoothing of an original TEC observation value through Savitzky-Golay filtering, then carrying out the subtraction of the observation value and a smooth value of TEC, and obtaining a residual error which is disturbance. The method is simple and rapidin calculation; the method is simple in operation and obvious in effect, Savitzky-Golay filtering is innovatively used for detecting the anomaly of the ionized layer TEC, the distribution characteristics such as the relative maximum value, the minimum value and the width of the ionized layer TEC are reserved, interference of daily fluctuation is reduced, and the reliability of a detection resultis greatly improved.
本发明公开了一种检测地震电离层TEC异常的方法,其步骤为:首先是采用Savitzky-Golay滤波对原始TEC观测值进行平滑处理,然后将TEC的观测值和平滑值做差,所得残差即为扰动。本发明方法计算简单快速,效果明显,创新性地利用Savitzky-Golay滤波进行电离层TEC的异常检测,该方法保留了电离层TEC的相对极大值、极小值和宽度等分布特性,减少了日常波动的干扰,大幅提高了检测结果的可靠性。</description><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDyTS3JyE9RyE9TSEktSU0uycxLVwhxdVZITMrLL8rNLKkESRWnZhbnZiYrZObnZValpijkJFamFvEwsKYl5hSn8kJpbgZFN9cQZw_d1IL8-NTigsTk1LzUknhnP0NDQ3MDCwNzU0djYtQAADZHLow</recordid><startdate>20200925</startdate><enddate>20200925</enddate><creator>ZHAI DULIN</creator><creator>ZHU FUYING</creator><creator>QING YUN</creator><creator>LIN JIAN</creator><scope>EVB</scope></search><sort><creationdate>20200925</creationdate><title>Method of detecting TEC abnormity of seismic ionized layer</title><author>ZHAI DULIN ; ZHU FUYING ; QING YUN ; LIN JIAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN111708075A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHAI DULIN</creatorcontrib><creatorcontrib>ZHU FUYING</creatorcontrib><creatorcontrib>QING YUN</creatorcontrib><creatorcontrib>LIN JIAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHAI DULIN</au><au>ZHU FUYING</au><au>QING YUN</au><au>LIN JIAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method of detecting TEC abnormity of seismic ionized layer</title><date>2020-09-25</date><risdate>2020</risdate><abstract>The invention discloses a method for detecting TEC abnormity of a seismic ionized layer, and the method comprises the steps: firstly carrying out the smoothing of an original TEC observation value through Savitzky-Golay filtering, then carrying out the subtraction of the observation value and a smooth value of TEC, and obtaining a residual error which is disturbance. The method is simple and rapidin calculation; the method is simple in operation and obvious in effect, Savitzky-Golay filtering is innovatively used for detecting the anomaly of the ionized layer TEC, the distribution characteristics such as the relative maximum value, the minimum value and the width of the ionized layer TEC are reserved, interference of daily fluctuation is reduced, and the reliability of a detection resultis greatly improved.
本发明公开了一种检测地震电离层TEC异常的方法,其步骤为:首先是采用Savitzky-Golay滤波对原始TEC观测值进行平滑处理,然后将TEC的观测值和平滑值做差,所得残差即为扰动。本发明方法计算简单快速,效果明显,创新性地利用Savitzky-Golay滤波进行电离层TEC的异常检测,该方法保留了电离层TEC的相对极大值、极小值和宽度等分布特性,减少了日常波动的干扰,大幅提高了检测结果的可靠性。</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING |
title | Method of detecting TEC abnormity of seismic ionized layer |
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