Semiconductor structure and manufacturing method thereof
The embodiment of the invention provides a semiconductor structure and a manufacturing method thereof. The method comprises: providing a silicon substrate, epitaxially forming a germanium film on thesilicon substrate, and epitaxially growing a gallium arsenide film on the germanium film, so that the...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The embodiment of the invention provides a semiconductor structure and a manufacturing method thereof. The method comprises: providing a silicon substrate, epitaxially forming a germanium film on thesilicon substrate, and epitaxially growing a gallium arsenide film on the germanium film, so that the germanium film is used as a buffer layer between the silicon substrate and the gallium arsenide film layer, improve lattice mismatch between the silicon substrate and the gallium arsenide film layer, reduce a reverse domain in the gallium arsenide film layer, reduce defects in the gallium arsenidefilm layer and improve the performance of a device based on the gallium arsenide film layer.
本申请实施例提供了一种半导体结构及其制造方法,包括提供硅衬底,在硅衬底上外延形成锗膜,在锗膜上外延生长砷化镓膜,这样将锗膜作为硅衬底和砷化镓膜层之间的缓冲层,改善硅衬底和砷化镓膜层之间的晶格失配,减少砷化镓膜层中的反向畴,减少砷化镓膜层中的缺陷,提高基于砷化镓膜层的器件的性能。 |
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