MDTD-based microscopic thermal imaging system performance evaluation method and system
The invention relates to an MDTD-based microscopic thermal imaging system performance evaluation method and system. The method comprises the following steps: acquiring optical path parameters of target radiation to be measured, optical path parameters of background radiation and parameters of a micr...
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| creator | GAO MEIJING HAN YING YAN QICHONG ZHANG BOZHI |
| description | The invention relates to an MDTD-based microscopic thermal imaging system performance evaluation method and system. The method comprises the following steps: acquiring optical path parameters of target radiation to be measured, optical path parameters of background radiation and parameters of a microscopic thermal imaging system; determining a spectral radiation flux difference of the target to bedetected and the background on the detector unit according to the optical path parameter of the target radiation to be detected and the optical path parameter of the background radiation; determiningthe noise equivalent temperature difference of the microscopic thermal imaging system according to the spectral radiation flux difference and the parameters of the microscopic thermal imaging system;determining the minimum detectable temperature difference according to the noise equivalent temperature difference and the parameters of the microscopic thermal imaging system; and evaluating the temperature resolution capabil |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN111579213A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN111579213A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN111579213A3</originalsourceid><addsrcrecordid>eNqNyrEKwjAQgOEsDqK-w_kAHWIRcZRWcdGpuJYzubaBJBdyUfDtdegDOP3D_y3V49Z2bfVEIQvBmcxiODkDZaIc0IMLOLo4gnykUIBEeeDfiIaA3uhfWBxHCFQmtoDRznCtFgN6oc3cldpezl1zrShxT5LQUKTSN3et9f5w3On6VP9jvi8rOdo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MDTD-based microscopic thermal imaging system performance evaluation method and system</title><source>esp@cenet</source><creator>GAO MEIJING ; HAN YING ; YAN QICHONG ; ZHANG BOZHI</creator><creatorcontrib>GAO MEIJING ; HAN YING ; YAN QICHONG ; ZHANG BOZHI</creatorcontrib><description>The invention relates to an MDTD-based microscopic thermal imaging system performance evaluation method and system. The method comprises the following steps: acquiring optical path parameters of target radiation to be measured, optical path parameters of background radiation and parameters of a microscopic thermal imaging system; determining a spectral radiation flux difference of the target to bedetected and the background on the detector unit according to the optical path parameter of the target radiation to be detected and the optical path parameter of the background radiation; determiningthe noise equivalent temperature difference of the microscopic thermal imaging system according to the spectral radiation flux difference and the parameters of the microscopic thermal imaging system;determining the minimum detectable temperature difference according to the noise equivalent temperature difference and the parameters of the microscopic thermal imaging system; and evaluating the temperature resolution capabil</description><language>chi ; eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200825&DB=EPODOC&CC=CN&NR=111579213A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200825&DB=EPODOC&CC=CN&NR=111579213A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GAO MEIJING</creatorcontrib><creatorcontrib>HAN YING</creatorcontrib><creatorcontrib>YAN QICHONG</creatorcontrib><creatorcontrib>ZHANG BOZHI</creatorcontrib><title>MDTD-based microscopic thermal imaging system performance evaluation method and system</title><description>The invention relates to an MDTD-based microscopic thermal imaging system performance evaluation method and system. The method comprises the following steps: acquiring optical path parameters of target radiation to be measured, optical path parameters of background radiation and parameters of a microscopic thermal imaging system; determining a spectral radiation flux difference of the target to bedetected and the background on the detector unit according to the optical path parameter of the target radiation to be detected and the optical path parameter of the background radiation; determiningthe noise equivalent temperature difference of the microscopic thermal imaging system according to the spectral radiation flux difference and the parameters of the microscopic thermal imaging system;determining the minimum detectable temperature difference according to the noise equivalent temperature difference and the parameters of the microscopic thermal imaging system; and evaluating the temperature resolution capabil</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQgOEsDqK-w_kAHWIRcZRWcdGpuJYzubaBJBdyUfDtdegDOP3D_y3V49Z2bfVEIQvBmcxiODkDZaIc0IMLOLo4gnykUIBEeeDfiIaA3uhfWBxHCFQmtoDRznCtFgN6oc3cldpezl1zrShxT5LQUKTSN3et9f5w3On6VP9jvi8rOdo</recordid><startdate>20200825</startdate><enddate>20200825</enddate><creator>GAO MEIJING</creator><creator>HAN YING</creator><creator>YAN QICHONG</creator><creator>ZHANG BOZHI</creator><scope>EVB</scope></search><sort><creationdate>20200825</creationdate><title>MDTD-based microscopic thermal imaging system performance evaluation method and system</title><author>GAO MEIJING ; HAN YING ; YAN QICHONG ; ZHANG BOZHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN111579213A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>GAO MEIJING</creatorcontrib><creatorcontrib>HAN YING</creatorcontrib><creatorcontrib>YAN QICHONG</creatorcontrib><creatorcontrib>ZHANG BOZHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GAO MEIJING</au><au>HAN YING</au><au>YAN QICHONG</au><au>ZHANG BOZHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MDTD-based microscopic thermal imaging system performance evaluation method and system</title><date>2020-08-25</date><risdate>2020</risdate><abstract>The invention relates to an MDTD-based microscopic thermal imaging system performance evaluation method and system. The method comprises the following steps: acquiring optical path parameters of target radiation to be measured, optical path parameters of background radiation and parameters of a microscopic thermal imaging system; determining a spectral radiation flux difference of the target to bedetected and the background on the detector unit according to the optical path parameter of the target radiation to be detected and the optical path parameter of the background radiation; determiningthe noise equivalent temperature difference of the microscopic thermal imaging system according to the spectral radiation flux difference and the parameters of the microscopic thermal imaging system;determining the minimum detectable temperature difference according to the noise equivalent temperature difference and the parameters of the microscopic thermal imaging system; and evaluating the temperature resolution capabil</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | MDTD-based microscopic thermal imaging system performance evaluation method and system |
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