Instrument and method for measuring flatness using linear light source

The invention discloses an instrument for measuring flatness using a linear light source. The instrument comprises a transmitting device and a receiving device. The transmitting device comprises a base and a transmitting part positioned above the base. The transmitting part is connected with a base...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HU YI, DENG ZENGWEN, XIAO LICUI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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