METHOD FOR MANUFACTURING NON-VOLATILE MEMORY

A method for manufacturing a non-volatile memory, comprising the following steps: forming a gate oxide layer (60) on a substrate (50); forming a stacked capacitor of a memory unit by subjecting logicgate polycrystalline silicon (10, 10') to a deposition process at least twice; removing excess l...

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Hauptverfasser: WANG TENGFENG, NING DAN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:A method for manufacturing a non-volatile memory, comprising the following steps: forming a gate oxide layer (60) on a substrate (50); forming a stacked capacitor of a memory unit by subjecting logicgate polycrystalline silicon (10, 10') to a deposition process at least twice; removing excess logic gate polycrystalline silicon (10, 10') by means of an etching process to form a memory transistor and a peripheral logic transistor. By forming a stacked capacitor of a memory unit by means of at least two deposition processes, the method manufactures a memory during a standard logic process such that the process for manufacturing a memory is simpler, has good compatibility with logic processes and is low cost. 一种非挥发性存储器的制造方法,包括步骤:在基底(50)上形成栅氧化层(60);将逻辑栅极多晶硅(10,10')通过至少两次沉积过程后,形成存储单元的叠层电容;通过蚀刻工艺移除多余的逻辑栅极多晶硅(10,10'),形成存储晶体管和外围逻辑晶体管。本发明所述方法,通过至少两次沉积形成存储晶体管的叠层电容,于标准逻辑工艺中制造出存储器,使得存储器的制造工艺更简单,与逻辑工艺兼容性好,成本低。