Measurement error analysis and modeling methodfor complex curved surface of part shell

The invention provides a measurement error analysis and modeling method for a complex curved surface of a part shell. The method comprises the following steps: carrying out error analysis and modelingwhen projections of two measuring heads on an XY plane are not overlapped, and carrying out error an...

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Hauptverfasser:	YU HANG, QIAO HUAN, WANG JING, WANG LIJUN, DU JUAN, CUI WANRUI, FAN YUE, ZHANG DASHUN, MIAO LIQIN, LI YUXIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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creator	YU HANG QIAO HUAN WANG JING WANG LIJUN DU JUAN CUI WANRUI FAN YUE ZHANG DASHUN MIAO LIQIN LI YUXIN
description	The invention provides a measurement error analysis and modeling method for a complex curved surface of a part shell. The method comprises the following steps: carrying out error analysis and modelingwhen projections of two measuring heads on an XY plane are not overlapped, and carrying out error analysis and modeling when vertex angle measurement deviation is caused by eccentricity of a modelingworkpiece and a rotary table. 本发明提供零件壳体复杂曲面测量误差分析与建模方法，包括下列内容：两个测头在XY平面投影不重合时的误差分析与建模工件与转台偏心引起顶角测量偏差时的误差分析与建模。
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The method comprises the following steps: carrying out error analysis and modelingwhen projections of two measuring heads on an XY plane are not overlapped, and carrying out error analysis and modeling when vertex angle measurement deviation is caused by eccentricity of a modelingworkpiece and a rotary table. 本发明提供零件壳体复杂曲面测量误差分析与建模方法，包括下列内容：两个测头在XY平面投影不重合时的误差分析与建模工件与转台偏心引起顶角测量偏差时的误差分析与建模。</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200612&DB=EPODOC&CC=CN&NR=111272126A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200612&DB=EPODOC&CC=CN&NR=111272126A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YU HANG</creatorcontrib><creatorcontrib>QIAO HUAN</creatorcontrib><creatorcontrib>WANG JING</creatorcontrib><creatorcontrib>WANG LIJUN</creatorcontrib><creatorcontrib>DU JUAN</creatorcontrib><creatorcontrib>CUI WANRUI</creatorcontrib><creatorcontrib>FAN YUE</creatorcontrib><creatorcontrib>ZHANG DASHUN</creatorcontrib><creatorcontrib>MIAO LIQIN</creatorcontrib><creatorcontrib>LI YUXIN</creatorcontrib><title>Measurement error analysis and modeling methodfor complex curved surface of part shell</title><description>The invention provides a measurement error analysis and modeling method for a complex curved surface of a part shell. The method comprises the following steps: carrying out error analysis and modelingwhen projections of two measuring heads on an XY plane are not overlapped, and carrying out error analysis and modeling when vertex angle measurement deviation is caused by eccentricity of a modelingworkpiece and a rotary table. 本发明提供零件壳体复杂曲面测量误差分析与建模方法，包括下列内容：两个测头在XY平面投影不重合时的误差分析与建模工件与转台偏心引起顶角测量偏差时的误差分析与建模。</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNizsKAjEURdNYiLqH5wIsEkFrGUZstBLbISQ3zkB-vGREd28KF2B1Lpx7luJxhS4zIyBWAnNi0lH7T5lKG5ZCsvBTfFJAHZN1zZsUssebzMwvWGq10waUHGXNlcoI79di4bQv2Py4Ettzf-8uO-Q0oOQWRNShu0kp1VFJdTjt__l8AWg_Ofc</recordid><startdate>20200612</startdate><enddate>20200612</enddate><creator>YU HANG</creator><creator>QIAO HUAN</creator><creator>WANG JING</creator><creator>WANG LIJUN</creator><creator>DU JUAN</creator><creator>CUI WANRUI</creator><creator>FAN YUE</creator><creator>ZHANG DASHUN</creator><creator>MIAO LIQIN</creator><creator>LI YUXIN</creator><scope>EVB</scope></search><sort><creationdate>20200612</creationdate><title>Measurement error analysis and modeling methodfor complex curved surface of part shell</title><author>YU HANG ; QIAO HUAN ; WANG JING ; WANG LIJUN ; DU JUAN ; CUI WANRUI ; FAN YUE ; ZHANG DASHUN ; MIAO LIQIN ; LI YUXIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN111272126A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YU HANG</creatorcontrib><creatorcontrib>QIAO HUAN</creatorcontrib><creatorcontrib>WANG JING</creatorcontrib><creatorcontrib>WANG LIJUN</creatorcontrib><creatorcontrib>DU JUAN</creatorcontrib><creatorcontrib>CUI WANRUI</creatorcontrib><creatorcontrib>FAN YUE</creatorcontrib><creatorcontrib>ZHANG DASHUN</creatorcontrib><creatorcontrib>MIAO LIQIN</creatorcontrib><creatorcontrib>LI YUXIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YU HANG</au><au>QIAO HUAN</au><au>WANG JING</au><au>WANG LIJUN</au><au>DU JUAN</au><au>CUI WANRUI</au><au>FAN YUE</au><au>ZHANG DASHUN</au><au>MIAO LIQIN</au><au>LI YUXIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Measurement error analysis and modeling methodfor complex curved surface of part shell</title><date>2020-06-12</date><risdate>2020</risdate><abstract>The invention provides a measurement error analysis and modeling method for a complex curved surface of a part shell. 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subjects	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
title	Measurement error analysis and modeling methodfor complex curved surface of part shell
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