Calibration method for scanning system of charged particle beam processing equipment
The invention discloses a calibration method for a scanning system of charged particle beam processing equipment, wherein the method comprises the steps: firstly, establishing a relationship between n-phase winding exciting current instructions and phase displacement of a charged particle beam on co...
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creator | WEI SHOUQI HUANG GUOHUA LIANG ZUMING FEI XIANG DONG YANG ZHANG TONG GUO WENMING HUANG XIAODONG TANG QIANG |
description | The invention discloses a calibration method for a scanning system of charged particle beam processing equipment, wherein the method comprises the steps: firstly, establishing a relationship between n-phase winding exciting current instructions and phase displacement of a charged particle beam on corresponding phase winding scanning axes on a working plane, and establishing a one-to-one correspondence relationship between resultant displacement of the charged particle beam on the working plane and ideal phase displacement; obtaining an included angle of n-phase winding scanning axes; correcting the phase displacement of the resultant displacement on the ideal n-phase winding scanning axis into the phase displacement on the n-phase winding scanning axes according to the included angle; andfinally, according to the relationship between the phase exciting current instructions and the phase displacement, and the relationship between the resultant displacement and the phase displacement onthe n-phase winding scann |
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HUANG XIAODONG ; TANG QIANG</creatorcontrib><description>The invention discloses a calibration method for a scanning system of charged particle beam processing equipment, wherein the method comprises the steps: firstly, establishing a relationship between n-phase winding exciting current instructions and phase displacement of a charged particle beam on corresponding phase winding scanning axes on a working plane, and establishing a one-to-one correspondence relationship between resultant displacement of the charged particle beam on the working plane and ideal phase displacement; obtaining an included angle of n-phase winding scanning axes; correcting the phase displacement of the resultant displacement on the ideal n-phase winding scanning axis into the phase displacement on the n-phase winding scanning axes according to the included angle; andfinally, according to the relationship between the phase exciting current instructions and the phase displacement, and the relationship between the resultant displacement and the phase displacement onthe n-phase winding scann</description><language>chi ; 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obtaining an included angle of n-phase winding scanning axes; correcting the phase displacement of the resultant displacement on the ideal n-phase winding scanning axis into the phase displacement on the n-phase winding scanning axes according to the included angle; andfinally, according to the relationship between the phase exciting current instructions and the phase displacement, and the relationship between the resultant displacement and the phase displacement onthe n-phase winding scann</description><subject>GAMMA RAY OR X-RAY MICROSCOPES</subject><subject>IRRADIATION DEVICES</subject><subject>NUCLEAR ENGINEERING</subject><subject>NUCLEAR PHYSICS</subject><subject>PHYSICS</subject><subject>TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyr0KwjAUBtAsDqK-w_UBHGLAXUrFyal7uU2_tIH8mRsH314EH8DpLGerho6Dnyo3nxNFtDXP5HIlsZySTwvJWxoiZUd25bpgpsK1eRtAEzhSqdlC5FvxfPkSkdpebRwHweHnTh1v_dDdTyh5hBS2SGhj99Bany_aaHM1_5wPyJs5KA</recordid><startdate>20200609</startdate><enddate>20200609</enddate><creator>WEI SHOUQI</creator><creator>HUANG GUOHUA</creator><creator>LIANG ZUMING</creator><creator>FEI XIANG</creator><creator>DONG YANG</creator><creator>ZHANG TONG</creator><creator>GUO WENMING</creator><creator>HUANG XIAODONG</creator><creator>TANG QIANG</creator><scope>EVB</scope></search><sort><creationdate>20200609</creationdate><title>Calibration method for scanning system of charged particle beam processing equipment</title><author>WEI SHOUQI ; 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obtaining an included angle of n-phase winding scanning axes; correcting the phase displacement of the resultant displacement on the ideal n-phase winding scanning axis into the phase displacement on the n-phase winding scanning axes according to the included angle; andfinally, according to the relationship between the phase exciting current instructions and the phase displacement, and the relationship between the resultant displacement and the phase displacement onthe n-phase winding scann</abstract><oa>free_for_read</oa></addata></record> |
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subjects | GAMMA RAY OR X-RAY MICROSCOPES IRRADIATION DEVICES NUCLEAR ENGINEERING NUCLEAR PHYSICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR |
title | Calibration method for scanning system of charged particle beam processing equipment |
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