Signal source
The invention provides a signal source used for calibrating a high-frequency electrotome analyzer. The signal source comprises a signal generation unit and a calibration unit, and the signal generation unit is used for generating signals and outputting a signal to the calibration unit and the high-f...
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| creator | ZHAN ZHIQIANG XIA MING XIA JUNWEN YU LEI GAO JIANQIANG ZHANG DONG WANG YUNLING |
| description | The invention provides a signal source used for calibrating a high-frequency electrotome analyzer. The signal source comprises a signal generation unit and a calibration unit, and the signal generation unit is used for generating signals and outputting a signal to the calibration unit and the high-frequency electrotome analyzer respectively; and the calibration unit is used for measuring a high-frequency current value and a high-frequency voltage value of the signal, comparing the high-frequency current value and the high-frequency voltage value of the signal measured by the high-frequency electrotome analyzer, and then calibrating the high-frequency electrotome analyzer according to the comparison result. The high-frequency electrotome analyzer is used for measuring the current and voltage values of the signal; meanwhile, the calibration unit is used for measuring the current and voltage values of the signal, and whether the result of the high-frequency electrotome analyzer is accurate is determined by compa |
| format | Patent |
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The signal source comprises a signal generation unit and a calibration unit, and the signal generation unit is used for generating signals and outputting a signal to the calibration unit and the high-frequency electrotome analyzer respectively; and the calibration unit is used for measuring a high-frequency current value and a high-frequency voltage value of the signal, comparing the high-frequency current value and the high-frequency voltage value of the signal measured by the high-frequency electrotome analyzer, and then calibrating the high-frequency electrotome analyzer according to the comparison result. 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| language | chi ; eng |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Signal source |
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