SYSTEM FOR TEAR ANALYSIS OF FILMS
A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; and a tear analysis device configured to tear the film sample and measure a characteristic of the tear. The movable sy...
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| creator | WANG JIN MCCARTY DONALD L GUNTHER ROBERT A MYERS KYLE A COLLICK SCOTT J SOLANKI SANJAY C |
| description | A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; and a tear analysis device configured to tear the film sample and measure a characteristic of the tear. The movable system is configured to move the film sample in the material holder system to the tear analysis device.
本文描述用于分析膜样品的物理特性的方法和系统。所述系统包括被配置成保持所述膜样品的材料保持器系统；和被配置成撕裂所述膜样品并且测量所述撕裂的特性的撕裂分析装置。可移动系统被配置成将所述材料保持器系统中的所述膜样品移动到所述撕裂分析装置。 |
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本文描述用于分析膜样品的物理特性的方法和系统。所述系统包括被配置成保持所述膜样品的材料保持器系统；和被配置成撕裂所述膜样品并且测量所述撕裂的特性的撕裂分析装置。可移动系统被配置成将所述材料保持器系统中的所述膜样品移动到所述撕裂分析装置。</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200424&DB=EPODOC&CC=CN&NR=111065908A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200424&DB=EPODOC&CC=CN&NR=111065908A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANG JIN</creatorcontrib><creatorcontrib>MCCARTY DONALD L</creatorcontrib><creatorcontrib>GUNTHER ROBERT A</creatorcontrib><creatorcontrib>MYERS KYLE A</creatorcontrib><creatorcontrib>COLLICK SCOTT J</creatorcontrib><creatorcontrib>SOLANKI SANJAY C</creatorcontrib><title>SYSTEM FOR TEAR ANALYSIS OF FILMS</title><description>A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; and a tear analysis device configured to tear the film sample and measure a characteristic of the tear. The movable system is configured to move the film sample in the material holder system to the tear analysis device.
本文描述用于分析膜样品的物理特性的方法和系统。所述系统包括被配置成保持所述膜样品的材料保持器系统；和被配置成撕裂所述膜样品并且测量所述撕裂的特性的撕裂分析装置。可移动系统被配置成将所述材料保持器系统中的所述膜样品移动到所述撕裂分析装置。</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAMjgwOcfVVcPMPUghxdQxScPRz9IkM9gxW8HdTcPP08Q3mYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxzn6GhoYGZqaWBhaOxsSoAQAPHCIS</recordid><startdate>20200424</startdate><enddate>20200424</enddate><creator>WANG JIN</creator><creator>MCCARTY DONALD L</creator><creator>GUNTHER ROBERT A</creator><creator>MYERS KYLE A</creator><creator>COLLICK SCOTT J</creator><creator>SOLANKI SANJAY C</creator><scope>EVB</scope></search><sort><creationdate>20200424</creationdate><title>SYSTEM FOR TEAR ANALYSIS OF FILMS</title><author>WANG JIN ; MCCARTY DONALD L ; GUNTHER ROBERT A ; MYERS KYLE A ; COLLICK SCOTT J ; SOLANKI SANJAY C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN111065908A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WANG JIN</creatorcontrib><creatorcontrib>MCCARTY DONALD L</creatorcontrib><creatorcontrib>GUNTHER ROBERT A</creatorcontrib><creatorcontrib>MYERS KYLE A</creatorcontrib><creatorcontrib>COLLICK SCOTT J</creatorcontrib><creatorcontrib>SOLANKI SANJAY C</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANG JIN</au><au>MCCARTY DONALD L</au><au>GUNTHER ROBERT A</au><au>MYERS KYLE A</au><au>COLLICK SCOTT J</au><au>SOLANKI SANJAY C</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM FOR TEAR ANALYSIS OF FILMS</title><date>2020-04-24</date><risdate>2020</risdate><abstract>A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; and a tear analysis device configured to tear the film sample and measure a characteristic of the tear. The movable system is configured to move the film sample in the material holder system to the tear analysis device.
本文描述用于分析膜样品的物理特性的方法和系统。所述系统包括被配置成保持所述膜样品的材料保持器系统；和被配置成撕裂所述膜样品并且测量所述撕裂的特性的撕裂分析装置。可移动系统被配置成将所述材料保持器系统中的所述膜样品移动到所述撕裂分析装置。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | SYSTEM FOR TEAR ANALYSIS OF FILMS |
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