Similarity threshold determination method considering average fluctuation ratios of voltage curves

Similarity threshold determination method considering average fluctuation ratios of voltage curves

The invention provides a similarity threshold determination method considering the average fluctuation ratio of voltage curves. The method comprises the following steps of: A, obtaining distribution transformer related data which comprise corresponding relations between a 10kV line and distribution...

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Hauptverfasser: ZHOU SHAOXIAN, WANG XIAOLIANG, WANG WENSHUO, YANG ZHICHUN, LEI YANG, YANG FAN, YAN FANGBIN, WANG JIN, CHEN XIAOMING, HU WEI, SU LEI, SHEN YU, TANG ZEYANG, JIANG WEI, SHU XIN, CHE FANGYI
Format: Patent
Sprache:chi ; eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
HANDLING RECORD CARRIERS
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
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creator ZHOU SHAOXIAN
WANG XIAOLIANG
WANG WENSHUO
YANG ZHICHUN
LEI YANG
YANG FAN
YAN FANGBIN
WANG JIN
CHEN XIAOMING
HU WEI
SU LEI
SHEN YU
TANG ZEYANG
JIANG WEI
SHU XIN
CHE FANGYI
description The invention provides a similarity threshold determination method considering the average fluctuation ratio of voltage curves. The method comprises the following steps of: A, obtaining distribution transformer related data which comprise corresponding relations between a 10kV line and distribution transformers, the names of the distribution transformers, the address codes of the distribution transformers, and the outlet voltage data of the distribution transformers; B, performing dimension reduction processing on the outlet voltage data of the distribution transformers acquired in the step A;C, calculating the average fluctuation ratio of voltage curves according to the outlet voltage data of the distribution transformers subjected to the dimension reduction processing in the step B; D,calculating the similarity of the voltage curves of the transformers of a transformer area under the same 10kV line according to the outlet voltage data of the distribution transformers preprocessed in the step B; and E, gradi
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN110991527A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN110991527A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN110991527A3</originalsourceid><addsrcrecordid>eNqNyrEKwjAQgOEuDqK-w_kAglVEOpaiOLnoXmJybQ_SXLlcAr69FH0Ap2_4_2XxetBI3gjpG3QQjAN7Bw4VZaRglDjAiDqwA8shkkOh0IPJKKZH6Hyymr6bzETgDjJ7natNkjGui0VnfMTNz1WxvV6ezW2HE7cYJ2MxoLbNvSz3VVWeDuf6-M_zASSdP4Y</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Similarity threshold determination method considering average fluctuation ratios of voltage curves</title><source>esp@cenet</source><creator>ZHOU SHAOXIAN ; WANG XIAOLIANG ; WANG WENSHUO ; YANG ZHICHUN ; LEI YANG ; YANG FAN ; YAN FANGBIN ; WANG JIN ; CHEN XIAOMING ; HU WEI ; SU LEI ; SHEN YU ; TANG ZEYANG ; JIANG WEI ; SHU XIN ; CHE FANGYI</creator><creatorcontrib>ZHOU SHAOXIAN ; WANG XIAOLIANG ; WANG WENSHUO ; YANG ZHICHUN ; LEI YANG ; YANG FAN ; YAN FANGBIN ; WANG JIN ; CHEN XIAOMING ; HU WEI ; SU LEI ; SHEN YU ; TANG ZEYANG ; JIANG WEI ; SHU XIN ; CHE FANGYI</creatorcontrib><description>The invention provides a similarity threshold determination method considering the average fluctuation ratio of voltage curves. The method comprises the following steps of: A, obtaining distribution transformer related data which comprise corresponding relations between a 10kV line and distribution transformers, the names of the distribution transformers, the address codes of the distribution transformers, and the outlet voltage data of the distribution transformers; B, performing dimension reduction processing on the outlet voltage data of the distribution transformers acquired in the step A;C, calculating the average fluctuation ratio of voltage curves according to the outlet voltage data of the distribution transformers subjected to the dimension reduction processing in the step B; D,calculating the similarity of the voltage curves of the transformers of a transformer area under the same 10kV line according to the outlet voltage data of the distribution transformers preprocessed in the step B; and E, gradi</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; HANDLING RECORD CARRIERS ; PHYSICS ; PRESENTATION OF DATA ; RECOGNITION OF DATA ; RECORD CARRIERS</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200410&amp;DB=EPODOC&amp;CC=CN&amp;NR=110991527A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200410&amp;DB=EPODOC&amp;CC=CN&amp;NR=110991527A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHOU SHAOXIAN</creatorcontrib><creatorcontrib>WANG XIAOLIANG</creatorcontrib><creatorcontrib>WANG WENSHUO</creatorcontrib><creatorcontrib>YANG ZHICHUN</creatorcontrib><creatorcontrib>LEI YANG</creatorcontrib><creatorcontrib>YANG FAN</creatorcontrib><creatorcontrib>YAN FANGBIN</creatorcontrib><creatorcontrib>WANG JIN</creatorcontrib><creatorcontrib>CHEN XIAOMING</creatorcontrib><creatorcontrib>HU WEI</creatorcontrib><creatorcontrib>SU LEI</creatorcontrib><creatorcontrib>SHEN YU</creatorcontrib><creatorcontrib>TANG ZEYANG</creatorcontrib><creatorcontrib>JIANG WEI</creatorcontrib><creatorcontrib>SHU XIN</creatorcontrib><creatorcontrib>CHE FANGYI</creatorcontrib><title>Similarity threshold determination method considering average fluctuation ratios of voltage curves</title><description>The invention provides a similarity threshold determination method considering the average fluctuation ratio of voltage curves. The method comprises the following steps of: A, obtaining distribution transformer related data which comprise corresponding relations between a 10kV line and distribution transformers, the names of the distribution transformers, the address codes of the distribution transformers, and the outlet voltage data of the distribution transformers; B, performing dimension reduction processing on the outlet voltage data of the distribution transformers acquired in the step A;C, calculating the average fluctuation ratio of voltage curves according to the outlet voltage data of the distribution transformers subjected to the dimension reduction processing in the step B; D,calculating the similarity of the voltage curves of the transformers of a transformer area under the same 10kV line according to the outlet voltage data of the distribution transformers preprocessed in the step B; and E, gradi</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>HANDLING RECORD CARRIERS</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQgOEuDqK-w_kAglVEOpaiOLnoXmJybQ_SXLlcAr69FH0Ap2_4_2XxetBI3gjpG3QQjAN7Bw4VZaRglDjAiDqwA8shkkOh0IPJKKZH6Hyymr6bzETgDjJ7natNkjGui0VnfMTNz1WxvV6ezW2HE7cYJ2MxoLbNvSz3VVWeDuf6-M_zASSdP4Y</recordid><startdate>20200410</startdate><enddate>20200410</enddate><creator>ZHOU SHAOXIAN</creator><creator>WANG XIAOLIANG</creator><creator>WANG WENSHUO</creator><creator>YANG ZHICHUN</creator><creator>LEI YANG</creator><creator>YANG FAN</creator><creator>YAN FANGBIN</creator><creator>WANG JIN</creator><creator>CHEN XIAOMING</creator><creator>HU WEI</creator><creator>SU LEI</creator><creator>SHEN YU</creator><creator>TANG ZEYANG</creator><creator>JIANG WEI</creator><creator>SHU XIN</creator><creator>CHE FANGYI</creator><scope>EVB</scope></search><sort><creationdate>20200410</creationdate><title>Similarity threshold determination method considering average fluctuation ratios of voltage curves</title><author>ZHOU SHAOXIAN ; WANG XIAOLIANG ; WANG WENSHUO ; YANG ZHICHUN ; LEI YANG ; YANG FAN ; YAN FANGBIN ; WANG JIN ; CHEN XIAOMING ; HU WEI ; SU LEI ; SHEN YU ; TANG ZEYANG ; JIANG WEI ; SHU XIN ; CHE FANGYI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN110991527A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>HANDLING RECORD CARRIERS</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHOU SHAOXIAN</creatorcontrib><creatorcontrib>WANG XIAOLIANG</creatorcontrib><creatorcontrib>WANG WENSHUO</creatorcontrib><creatorcontrib>YANG ZHICHUN</creatorcontrib><creatorcontrib>LEI YANG</creatorcontrib><creatorcontrib>YANG FAN</creatorcontrib><creatorcontrib>YAN FANGBIN</creatorcontrib><creatorcontrib>WANG JIN</creatorcontrib><creatorcontrib>CHEN XIAOMING</creatorcontrib><creatorcontrib>HU WEI</creatorcontrib><creatorcontrib>SU LEI</creatorcontrib><creatorcontrib>SHEN YU</creatorcontrib><creatorcontrib>TANG ZEYANG</creatorcontrib><creatorcontrib>JIANG WEI</creatorcontrib><creatorcontrib>SHU XIN</creatorcontrib><creatorcontrib>CHE FANGYI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHOU SHAOXIAN</au><au>WANG XIAOLIANG</au><au>WANG WENSHUO</au><au>YANG ZHICHUN</au><au>LEI YANG</au><au>YANG FAN</au><au>YAN FANGBIN</au><au>WANG JIN</au><au>CHEN XIAOMING</au><au>HU WEI</au><au>SU LEI</au><au>SHEN YU</au><au>TANG ZEYANG</au><au>JIANG WEI</au><au>SHU XIN</au><au>CHE FANGYI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Similarity threshold determination method considering average fluctuation ratios of voltage curves</title><date>2020-04-10</date><risdate>2020</risdate><abstract>The invention provides a similarity threshold determination method considering the average fluctuation ratio of voltage curves. The method comprises the following steps of: A, obtaining distribution transformer related data which comprise corresponding relations between a 10kV line and distribution transformers, the names of the distribution transformers, the address codes of the distribution transformers, and the outlet voltage data of the distribution transformers; B, performing dimension reduction processing on the outlet voltage data of the distribution transformers acquired in the step A;C, calculating the average fluctuation ratio of voltage curves according to the outlet voltage data of the distribution transformers subjected to the dimension reduction processing in the step B; D,calculating the similarity of the voltage curves of the transformers of a transformer area under the same 10kV line according to the outlet voltage data of the distribution transformers preprocessed in the step B; and E, gradi</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
HANDLING RECORD CARRIERS
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
title Similarity threshold determination method considering average fluctuation ratios of voltage curves
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