Automatic sampling device and method for high-temperature and high-pressure dusty gas

The invention belongs to the technical field of high-temperature and high-pressure dusty gas sampling, particularly relates to an automatic sampling device and method for high-temperature and high-pressure dusty gas, and particularly relates to an automatic sampling device and method for high-temper...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZHANG QIKE, GAO WEI, LI SHENGPENG, WANG KUN, YANG FAN, MAO JIHUI, LAN WEIWEI, HU JINYU, LYU JUNJUN, DU PENGPENG, GUO YANXIN, QUAN YAWEN, LI XIAOHONG, LI ZENGBO, WEI JIANGTAO
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator ZHANG QIKE
GAO WEI
LI SHENGPENG
WANG KUN
YANG FAN
MAO JIHUI
LAN WEIWEI
HU JINYU
LYU JUNJUN
DU PENGPENG
GUO YANXIN
QUAN YAWEN
LI XIAOHONG
LI ZENGBO
WEI JIANGTAO
description The invention belongs to the technical field of high-temperature and high-pressure dusty gas sampling, particularly relates to an automatic sampling device and method for high-temperature and high-pressure dusty gas, and particularly relates to an automatic sampling device and method for high-temperature and high-pressure dusty gas of an industrial furnace. The device comprises a chilling unit, apurifying unit, a drying unit and a sampling unit. The sampling method comprises the following steps of: system preparation, process gas replacement, gas sampling, cyclic regeneration and device initialization. The automatic sampling device and method for the high-temperature and high-pressure dusty gas have the characteristics of stable operation, difficult blockage, convenient disassembly and maintenance, high automation degree, simple sampling operation and high safety degree, and are suitable for pilot plant test devices and large-scale industrial devices. 本发明属于高温高压含尘气体取样技术领域,具体来说,涉及一种高温高压含尘气体的自动取样装置及取样方法,尤其涉及工业炉用
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN110987543A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN110987543A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN110987543A3</originalsourceid><addsrcrecordid>eNqNiksKwjAQQLNxIeodxgMULFXUZSmKK1e6LkMybQLNh8xE8Pbi5wCuHrz35ureFokexWlg9GlyYQRDD6cJMBjwJDYaGGIG60ZbCflEGaXkb__IlIn5bUxhecKIvFSzASem1Y8LtT6fbt2lohR74oSaAknfXet6czzsd9umbf55Xu2MOV0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automatic sampling device and method for high-temperature and high-pressure dusty gas</title><source>esp@cenet</source><creator>ZHANG QIKE ; GAO WEI ; LI SHENGPENG ; WANG KUN ; YANG FAN ; MAO JIHUI ; LAN WEIWEI ; HU JINYU ; LYU JUNJUN ; DU PENGPENG ; GUO YANXIN ; QUAN YAWEN ; LI XIAOHONG ; LI ZENGBO ; WEI JIANGTAO</creator><creatorcontrib>ZHANG QIKE ; GAO WEI ; LI SHENGPENG ; WANG KUN ; YANG FAN ; MAO JIHUI ; LAN WEIWEI ; HU JINYU ; LYU JUNJUN ; DU PENGPENG ; GUO YANXIN ; QUAN YAWEN ; LI XIAOHONG ; LI ZENGBO ; WEI JIANGTAO</creatorcontrib><description>The invention belongs to the technical field of high-temperature and high-pressure dusty gas sampling, particularly relates to an automatic sampling device and method for high-temperature and high-pressure dusty gas, and particularly relates to an automatic sampling device and method for high-temperature and high-pressure dusty gas of an industrial furnace. The device comprises a chilling unit, apurifying unit, a drying unit and a sampling unit. The sampling method comprises the following steps of: system preparation, process gas replacement, gas sampling, cyclic regeneration and device initialization. The automatic sampling device and method for the high-temperature and high-pressure dusty gas have the characteristics of stable operation, difficult blockage, convenient disassembly and maintenance, high automation degree, simple sampling operation and high safety degree, and are suitable for pilot plant test devices and large-scale industrial devices. 本发明属于高温高压含尘气体取样技术领域,具体来说,涉及一种高温高压含尘气体的自动取样装置及取样方法,尤其涉及工业炉用</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200410&amp;DB=EPODOC&amp;CC=CN&amp;NR=110987543A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200410&amp;DB=EPODOC&amp;CC=CN&amp;NR=110987543A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHANG QIKE</creatorcontrib><creatorcontrib>GAO WEI</creatorcontrib><creatorcontrib>LI SHENGPENG</creatorcontrib><creatorcontrib>WANG KUN</creatorcontrib><creatorcontrib>YANG FAN</creatorcontrib><creatorcontrib>MAO JIHUI</creatorcontrib><creatorcontrib>LAN WEIWEI</creatorcontrib><creatorcontrib>HU JINYU</creatorcontrib><creatorcontrib>LYU JUNJUN</creatorcontrib><creatorcontrib>DU PENGPENG</creatorcontrib><creatorcontrib>GUO YANXIN</creatorcontrib><creatorcontrib>QUAN YAWEN</creatorcontrib><creatorcontrib>LI XIAOHONG</creatorcontrib><creatorcontrib>LI ZENGBO</creatorcontrib><creatorcontrib>WEI JIANGTAO</creatorcontrib><title>Automatic sampling device and method for high-temperature and high-pressure dusty gas</title><description>The invention belongs to the technical field of high-temperature and high-pressure dusty gas sampling, particularly relates to an automatic sampling device and method for high-temperature and high-pressure dusty gas, and particularly relates to an automatic sampling device and method for high-temperature and high-pressure dusty gas of an industrial furnace. The device comprises a chilling unit, apurifying unit, a drying unit and a sampling unit. The sampling method comprises the following steps of: system preparation, process gas replacement, gas sampling, cyclic regeneration and device initialization. The automatic sampling device and method for the high-temperature and high-pressure dusty gas have the characteristics of stable operation, difficult blockage, convenient disassembly and maintenance, high automation degree, simple sampling operation and high safety degree, and are suitable for pilot plant test devices and large-scale industrial devices. 本发明属于高温高压含尘气体取样技术领域,具体来说,涉及一种高温高压含尘气体的自动取样装置及取样方法,尤其涉及工业炉用</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNiksKwjAQQLNxIeodxgMULFXUZSmKK1e6LkMybQLNh8xE8Pbi5wCuHrz35ureFokexWlg9GlyYQRDD6cJMBjwJDYaGGIG60ZbCflEGaXkb__IlIn5bUxhecKIvFSzASem1Y8LtT6fbt2lohR74oSaAknfXet6czzsd9umbf55Xu2MOV0</recordid><startdate>20200410</startdate><enddate>20200410</enddate><creator>ZHANG QIKE</creator><creator>GAO WEI</creator><creator>LI SHENGPENG</creator><creator>WANG KUN</creator><creator>YANG FAN</creator><creator>MAO JIHUI</creator><creator>LAN WEIWEI</creator><creator>HU JINYU</creator><creator>LYU JUNJUN</creator><creator>DU PENGPENG</creator><creator>GUO YANXIN</creator><creator>QUAN YAWEN</creator><creator>LI XIAOHONG</creator><creator>LI ZENGBO</creator><creator>WEI JIANGTAO</creator><scope>EVB</scope></search><sort><creationdate>20200410</creationdate><title>Automatic sampling device and method for high-temperature and high-pressure dusty gas</title><author>ZHANG QIKE ; GAO WEI ; LI SHENGPENG ; WANG KUN ; YANG FAN ; MAO JIHUI ; LAN WEIWEI ; HU JINYU ; LYU JUNJUN ; DU PENGPENG ; GUO YANXIN ; QUAN YAWEN ; LI XIAOHONG ; LI ZENGBO ; WEI JIANGTAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN110987543A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHANG QIKE</creatorcontrib><creatorcontrib>GAO WEI</creatorcontrib><creatorcontrib>LI SHENGPENG</creatorcontrib><creatorcontrib>WANG KUN</creatorcontrib><creatorcontrib>YANG FAN</creatorcontrib><creatorcontrib>MAO JIHUI</creatorcontrib><creatorcontrib>LAN WEIWEI</creatorcontrib><creatorcontrib>HU JINYU</creatorcontrib><creatorcontrib>LYU JUNJUN</creatorcontrib><creatorcontrib>DU PENGPENG</creatorcontrib><creatorcontrib>GUO YANXIN</creatorcontrib><creatorcontrib>QUAN YAWEN</creatorcontrib><creatorcontrib>LI XIAOHONG</creatorcontrib><creatorcontrib>LI ZENGBO</creatorcontrib><creatorcontrib>WEI JIANGTAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHANG QIKE</au><au>GAO WEI</au><au>LI SHENGPENG</au><au>WANG KUN</au><au>YANG FAN</au><au>MAO JIHUI</au><au>LAN WEIWEI</au><au>HU JINYU</au><au>LYU JUNJUN</au><au>DU PENGPENG</au><au>GUO YANXIN</au><au>QUAN YAWEN</au><au>LI XIAOHONG</au><au>LI ZENGBO</au><au>WEI JIANGTAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automatic sampling device and method for high-temperature and high-pressure dusty gas</title><date>2020-04-10</date><risdate>2020</risdate><abstract>The invention belongs to the technical field of high-temperature and high-pressure dusty gas sampling, particularly relates to an automatic sampling device and method for high-temperature and high-pressure dusty gas, and particularly relates to an automatic sampling device and method for high-temperature and high-pressure dusty gas of an industrial furnace. The device comprises a chilling unit, apurifying unit, a drying unit and a sampling unit. The sampling method comprises the following steps of: system preparation, process gas replacement, gas sampling, cyclic regeneration and device initialization. The automatic sampling device and method for the high-temperature and high-pressure dusty gas have the characteristics of stable operation, difficult blockage, convenient disassembly and maintenance, high automation degree, simple sampling operation and high safety degree, and are suitable for pilot plant test devices and large-scale industrial devices. 本发明属于高温高压含尘气体取样技术领域,具体来说,涉及一种高温高压含尘气体的自动取样装置及取样方法,尤其涉及工业炉用</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN110987543A
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Automatic sampling device and method for high-temperature and high-pressure dusty gas
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T09%3A10%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZHANG%20QIKE&rft.date=2020-04-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN110987543A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true