Buck converter circuit parameter parasitism and degradation analysis method

The invention belongs to the field of Buck converter circuit design, and particularly relates to a Buck converter circuit parameter parasitism and degradation analysis method based on a simplified unified model. The method comprises the following steps: (1) describing severe working conditions of th...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUN LANXIN, GE YANG, YING ZHAO, WANG YANMIN
Format: Patent
Sprache:chi ; eng
Schlagworte:
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