Buck converter circuit parameter parasitism and degradation analysis method
The invention belongs to the field of Buck converter circuit design, and particularly relates to a Buck converter circuit parameter parasitism and degradation analysis method based on a simplified unified model. The method comprises the following steps: (1) describing severe working conditions of th...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention belongs to the field of Buck converter circuit design, and particularly relates to a Buck converter circuit parameter parasitism and degradation analysis method based on a simplified unified model. The method comprises the following steps: (1) describing severe working conditions of the Buck converter; (2) establishing a Buck converter simplified model; (3) analyzing the influence ofparasitic parameters on the circuit performance; and (4) analyzing the influence of failure and degradation of the aluminum electrolytic capacitor on the circuit performance. Non-ideality and parasitic parameters of all components of the Buck converter are comprehensively considered, severe conditions of aluminum electrolytic capacitor failure and parameter degradation are jointly considered, anda simplified unified model is established and used for circuit performance analysis under various working conditions. Based on a simplified unified model of the Buck converter, quantitative influences of various severe condit |
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