Device and method for detecting defects in liquid crystal substrate box

The invention, which belongs to the technical field of liquid crystal substrate quality detection, discloses a device and method for detecting defects in a liquid crystal substrate box. The detectingdevice comprises an inspection bench, a light source assembly, a first polarizing assembly, a to-be-d...

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Hauptverfasser: YUAN JING, ZHENG JIANJUN, TAO FANGCHA, TANG HAIGEN, YIN XUNXUN
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Sprache:chi ; eng
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creator YUAN JING
ZHENG JIANJUN
TAO FANGCHA
TANG HAIGEN
YIN XUNXUN
description The invention, which belongs to the technical field of liquid crystal substrate quality detection, discloses a device and method for detecting defects in a liquid crystal substrate box. The detectingdevice comprises an inspection bench, a light source assembly, a first polarizing assembly, a to-be-detected substrate and a second polarizing assembly. The first polarizing assembly includes white glass and a first polaroid attached to the white glass. The second polarizing assembly includes white glass and a second polaroid attached to the white glass. The polarization direction of the first polaroid is perpendicular to that of the second polaroid; two surfaces of the to-be-detected substrate are in contact with the white glass; an ocular lens is arranged above the second polarizing assembly. The device has the following beneficial effects: the two polaroids having the polarization directions are perpendicular to each other are used for filtering light transmitted by the to-be-detected substrate; whether a defec
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subjects DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING
FREQUENCY-CHANGING
NON-LINEAR OPTICS
OPTICAL ANALOGUE/DIGITAL CONVERTERS
OPTICAL LOGIC ELEMENTS
OPTICS
PHYSICS
TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
title Device and method for detecting defects in liquid crystal substrate box
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