Semiconductor test socket with mixed coaxial structure and preparation method thereof

The invention relates to a semiconductor test socket with a mixed coaxial structure and a preparation method thereof. The semiconductor test socket comprises a test socket positioning plate, an insulation test socket parent body, an embedded conductive socket parent body, an embedded conductive sock...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SHI YUANJUN, YIN LANYONG, LIU KAI, YANG ZONGMAO, GAO ZONGYING
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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