Method for verifying performance of nano-photon sensor in contact network metal structure environment

The invention relates to the technical field of nano-photon sensors, and discloses a method for verifying the performance of a nano-photon sensor in a contact network metal structure environment. Themethod comprises the following steps: (1) designing a nano-photon sensor material structure model; (2...

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Bibliographische Detailangaben

Hauptverfasser:	WANG JIAN, GUI YUJIE, TANG WENLIANG, MA HAOHANG, YUE YU, LU TINGFENG, YUAN KE, TANG CHENLU, LI XIAOCHUN, XIANG JUNQIU
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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