Two-stage electroscope

The invention discloses a two-stage electroscope and aims at providing a two-stage electroscope capable of improving the operation safety. The two-stage electroscope comprises an operating rod, an electroscope head fixedly arranged on the operating rod, an electroscope contact and a conductor detect...

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Hauptverfasser: CHEN DAOYANG, DUAN JIACHUAN, WANG HAIYAN, DONG XI, CHENG ZHENGDA, JIANG YUPENG, ZHOU RUI, MENG WEILIYA, TIAN HAO, FANG YUAN, YUAN ZHONG, ZHANG QIAN, CHEN XIAXIAO, SONG QING, WU QIANG, LIU YINGJIE, SUN RUOFENG, ZHANG JIANPENG, YANG KAI, ZHU LINGXIAO, HU CHANGBIN, LIANG KAI, XUE BOSHUI, YIN JUN, CHEN DEKAI, WANG QING, ZHANG XINYANG
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creator CHEN DAOYANG
DUAN JIACHUAN
WANG HAIYAN
DONG XI
CHENG ZHENGDA
JIANG YUPENG
ZHOU RUI
MENG WEILIYA
TIAN HAO
FANG YUAN
YUAN ZHONG
ZHANG QIAN
CHEN XIAXIAO
SONG QING
WU QIANG
LIU YINGJIE
SUN RUOFENG
ZHANG JIANPENG
YANG KAI
ZHU LINGXIAO
HU CHANGBIN
LIANG KAI
XUE BOSHUI
YIN JUN
CHEN DEKAI
WANG QING
ZHANG XINYANG
description The invention discloses a two-stage electroscope and aims at providing a two-stage electroscope capable of improving the operation safety. The two-stage electroscope comprises an operating rod, an electroscope head fixedly arranged on the operating rod, an electroscope contact and a conductor detection contact, wherein the electroscope contact is arranged on the electroscope head and is provided with a self-inspection button; a telescopic structure is adopted by the electroscope contact; the conductor detection contact is arranged on the electroscope head and is parallel to the electroscope head; the conductor detection contact is connected with the electroscope contact in parallel and is used for detecting whether an object in contact with the electroscope contact is a conductor or not; adisplay lamp used for displaying whether the object in contact with the electroscope contact is the conductor or not is arranged on the electroscope head; and the structure of the conductor detectioncontact is the same as th
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN110609168A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN110609168A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN110609168A3</originalsourceid><addsrcrecordid>eNrjZBALKc_XLS5JTE9VSM1JTS4pyi9Ozi9I5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoYGZgaWhmYWjsbEqAEAqYQhoA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Two-stage electroscope</title><source>esp@cenet</source><creator>CHEN DAOYANG ; DUAN JIACHUAN ; WANG HAIYAN ; DONG XI ; CHENG ZHENGDA ; JIANG YUPENG ; ZHOU RUI ; MENG WEILIYA ; TIAN HAO ; FANG YUAN ; YUAN ZHONG ; ZHANG QIAN ; CHEN XIAXIAO ; SONG QING ; WU QIANG ; LIU YINGJIE ; SUN RUOFENG ; ZHANG JIANPENG ; YANG KAI ; ZHU LINGXIAO ; HU CHANGBIN ; LIANG KAI ; XUE BOSHUI ; YIN JUN ; CHEN DEKAI ; WANG QING ; ZHANG XINYANG</creator><creatorcontrib>CHEN DAOYANG ; DUAN JIACHUAN ; WANG HAIYAN ; DONG XI ; CHENG ZHENGDA ; JIANG YUPENG ; ZHOU RUI ; MENG WEILIYA ; TIAN HAO ; FANG YUAN ; YUAN ZHONG ; ZHANG QIAN ; CHEN XIAXIAO ; SONG QING ; WU QIANG ; LIU YINGJIE ; SUN RUOFENG ; ZHANG JIANPENG ; YANG KAI ; ZHU LINGXIAO ; HU CHANGBIN ; LIANG KAI ; XUE BOSHUI ; YIN JUN ; CHEN DEKAI ; WANG QING ; ZHANG XINYANG</creatorcontrib><description>The invention discloses a two-stage electroscope and aims at providing a two-stage electroscope capable of improving the operation safety. The two-stage electroscope comprises an operating rod, an electroscope head fixedly arranged on the operating rod, an electroscope contact and a conductor detection contact, wherein the electroscope contact is arranged on the electroscope head and is provided with a self-inspection button; a telescopic structure is adopted by the electroscope contact; the conductor detection contact is arranged on the electroscope head and is parallel to the electroscope head; the conductor detection contact is connected with the electroscope contact in parallel and is used for detecting whether an object in contact with the electroscope contact is a conductor or not; adisplay lamp used for displaying whether the object in contact with the electroscope contact is the conductor or not is arranged on the electroscope head; and the structure of the conductor detectioncontact is the same as th</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20191224&amp;DB=EPODOC&amp;CC=CN&amp;NR=110609168A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20191224&amp;DB=EPODOC&amp;CC=CN&amp;NR=110609168A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN DAOYANG</creatorcontrib><creatorcontrib>DUAN JIACHUAN</creatorcontrib><creatorcontrib>WANG HAIYAN</creatorcontrib><creatorcontrib>DONG XI</creatorcontrib><creatorcontrib>CHENG ZHENGDA</creatorcontrib><creatorcontrib>JIANG YUPENG</creatorcontrib><creatorcontrib>ZHOU RUI</creatorcontrib><creatorcontrib>MENG WEILIYA</creatorcontrib><creatorcontrib>TIAN HAO</creatorcontrib><creatorcontrib>FANG YUAN</creatorcontrib><creatorcontrib>YUAN ZHONG</creatorcontrib><creatorcontrib>ZHANG QIAN</creatorcontrib><creatorcontrib>CHEN XIAXIAO</creatorcontrib><creatorcontrib>SONG QING</creatorcontrib><creatorcontrib>WU QIANG</creatorcontrib><creatorcontrib>LIU YINGJIE</creatorcontrib><creatorcontrib>SUN RUOFENG</creatorcontrib><creatorcontrib>ZHANG JIANPENG</creatorcontrib><creatorcontrib>YANG KAI</creatorcontrib><creatorcontrib>ZHU LINGXIAO</creatorcontrib><creatorcontrib>HU CHANGBIN</creatorcontrib><creatorcontrib>LIANG KAI</creatorcontrib><creatorcontrib>XUE BOSHUI</creatorcontrib><creatorcontrib>YIN JUN</creatorcontrib><creatorcontrib>CHEN DEKAI</creatorcontrib><creatorcontrib>WANG QING</creatorcontrib><creatorcontrib>ZHANG XINYANG</creatorcontrib><title>Two-stage electroscope</title><description>The invention discloses a two-stage electroscope and aims at providing a two-stage electroscope capable of improving the operation safety. The two-stage electroscope comprises an operating rod, an electroscope head fixedly arranged on the operating rod, an electroscope contact and a conductor detection contact, wherein the electroscope contact is arranged on the electroscope head and is provided with a self-inspection button; a telescopic structure is adopted by the electroscope contact; the conductor detection contact is arranged on the electroscope head and is parallel to the electroscope head; the conductor detection contact is connected with the electroscope contact in parallel and is used for detecting whether an object in contact with the electroscope contact is a conductor or not; adisplay lamp used for displaying whether the object in contact with the electroscope contact is the conductor or not is arranged on the electroscope head; and the structure of the conductor detectioncontact is the same as th</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBALKc_XLS5JTE9VSM1JTS4pyi9Ozi9I5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFicmpeakl8c5-hoYGZgaWhmYWjsbEqAEAqYQhoA</recordid><startdate>20191224</startdate><enddate>20191224</enddate><creator>CHEN DAOYANG</creator><creator>DUAN JIACHUAN</creator><creator>WANG HAIYAN</creator><creator>DONG XI</creator><creator>CHENG ZHENGDA</creator><creator>JIANG YUPENG</creator><creator>ZHOU RUI</creator><creator>MENG WEILIYA</creator><creator>TIAN HAO</creator><creator>FANG YUAN</creator><creator>YUAN ZHONG</creator><creator>ZHANG QIAN</creator><creator>CHEN XIAXIAO</creator><creator>SONG QING</creator><creator>WU QIANG</creator><creator>LIU YINGJIE</creator><creator>SUN RUOFENG</creator><creator>ZHANG JIANPENG</creator><creator>YANG KAI</creator><creator>ZHU LINGXIAO</creator><creator>HU CHANGBIN</creator><creator>LIANG KAI</creator><creator>XUE BOSHUI</creator><creator>YIN JUN</creator><creator>CHEN DEKAI</creator><creator>WANG QING</creator><creator>ZHANG XINYANG</creator><scope>EVB</scope></search><sort><creationdate>20191224</creationdate><title>Two-stage electroscope</title><author>CHEN DAOYANG ; DUAN JIACHUAN ; WANG HAIYAN ; DONG XI ; CHENG ZHENGDA ; JIANG YUPENG ; ZHOU RUI ; MENG WEILIYA ; TIAN HAO ; FANG YUAN ; YUAN ZHONG ; ZHANG QIAN ; CHEN XIAXIAO ; SONG QING ; WU QIANG ; LIU YINGJIE ; SUN RUOFENG ; ZHANG JIANPENG ; YANG KAI ; ZHU LINGXIAO ; HU CHANGBIN ; LIANG KAI ; XUE BOSHUI ; YIN JUN ; CHEN DEKAI ; WANG QING ; ZHANG XINYANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN110609168A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2019</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN DAOYANG</creatorcontrib><creatorcontrib>DUAN JIACHUAN</creatorcontrib><creatorcontrib>WANG HAIYAN</creatorcontrib><creatorcontrib>DONG XI</creatorcontrib><creatorcontrib>CHENG ZHENGDA</creatorcontrib><creatorcontrib>JIANG YUPENG</creatorcontrib><creatorcontrib>ZHOU RUI</creatorcontrib><creatorcontrib>MENG WEILIYA</creatorcontrib><creatorcontrib>TIAN HAO</creatorcontrib><creatorcontrib>FANG YUAN</creatorcontrib><creatorcontrib>YUAN ZHONG</creatorcontrib><creatorcontrib>ZHANG QIAN</creatorcontrib><creatorcontrib>CHEN XIAXIAO</creatorcontrib><creatorcontrib>SONG QING</creatorcontrib><creatorcontrib>WU QIANG</creatorcontrib><creatorcontrib>LIU YINGJIE</creatorcontrib><creatorcontrib>SUN RUOFENG</creatorcontrib><creatorcontrib>ZHANG JIANPENG</creatorcontrib><creatorcontrib>YANG KAI</creatorcontrib><creatorcontrib>ZHU LINGXIAO</creatorcontrib><creatorcontrib>HU CHANGBIN</creatorcontrib><creatorcontrib>LIANG KAI</creatorcontrib><creatorcontrib>XUE BOSHUI</creatorcontrib><creatorcontrib>YIN JUN</creatorcontrib><creatorcontrib>CHEN DEKAI</creatorcontrib><creatorcontrib>WANG QING</creatorcontrib><creatorcontrib>ZHANG XINYANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN DAOYANG</au><au>DUAN JIACHUAN</au><au>WANG HAIYAN</au><au>DONG XI</au><au>CHENG ZHENGDA</au><au>JIANG YUPENG</au><au>ZHOU RUI</au><au>MENG WEILIYA</au><au>TIAN HAO</au><au>FANG YUAN</au><au>YUAN ZHONG</au><au>ZHANG QIAN</au><au>CHEN XIAXIAO</au><au>SONG QING</au><au>WU QIANG</au><au>LIU YINGJIE</au><au>SUN RUOFENG</au><au>ZHANG JIANPENG</au><au>YANG KAI</au><au>ZHU LINGXIAO</au><au>HU CHANGBIN</au><au>LIANG KAI</au><au>XUE BOSHUI</au><au>YIN JUN</au><au>CHEN DEKAI</au><au>WANG QING</au><au>ZHANG XINYANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Two-stage electroscope</title><date>2019-12-24</date><risdate>2019</risdate><abstract>The invention discloses a two-stage electroscope and aims at providing a two-stage electroscope capable of improving the operation safety. The two-stage electroscope comprises an operating rod, an electroscope head fixedly arranged on the operating rod, an electroscope contact and a conductor detection contact, wherein the electroscope contact is arranged on the electroscope head and is provided with a self-inspection button; a telescopic structure is adopted by the electroscope contact; the conductor detection contact is arranged on the electroscope head and is parallel to the electroscope head; the conductor detection contact is connected with the electroscope contact in parallel and is used for detecting whether an object in contact with the electroscope contact is a conductor or not; adisplay lamp used for displaying whether the object in contact with the electroscope contact is the conductor or not is arranged on the electroscope head; and the structure of the conductor detectioncontact is the same as th</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Two-stage electroscope
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