Fault reason suspected degree analysis method based on metering abnormity correlation degree model

The invention discloses a fault reason suspected degree analysis method based on a metering abnormity correlation degree model, and relates to a fault reason suspected degree analysis method. In dailyoperation, many kinds of metering anomalies exist, the situation is complex, and effective analysis,...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WU GUOCHENG, CAI YI, ZHANG JIE, SHEN HAIHONG, LIAO SHAOCHENG, WU JIANPING, LI JING, WANG WEIFENG, SUN GANG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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