Method for analyzing mechanical property deficiency of test rod through scanning electron microscope and microscope

Method for analyzing mechanical property deficiency of test rod through scanning electron microscope and microscope

The invention discloses a method for analyzing mechanical property deficiency of a test rod through a scanning electron microscope and a microscope in the technical field of aviation casting. The method comprises the following specific implementation steps of: 1, observing whether a fracture of the...

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Hauptverfasser: YUAN DEBEI, XU CHAO, GAO JIE
Format: Patent
Sprache:chi ; eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator YUAN DEBEI
XU CHAO
GAO JIE
description The invention discloses a method for analyzing mechanical property deficiency of a test rod through a scanning electron microscope and a microscope in the technical field of aviation casting. The method comprises the following specific implementation steps of: 1, observing whether a fracture of the test rod which fails the test has a defect or not, and carrying out FPI detection; 2, observing crystal grains of the test rod; 3, cutting open the test rod, and determining the distribution of columnar crystals and isometric crystals; 4, making the test rod into a sample, corroding the sample, andobserving the structure of the sample by using the electron microscope; 5, observing the tissue structure of the sample by using the scanning electron microscope; 6, finding out the reason of test failure by combining the electron microscope and the scanning electron microscope analysis results; and 7, finding out a solution according to the conclusion obtained above. The problem that since no scientific method exists to
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Method for analyzing mechanical property deficiency of test rod through scanning electron microscope and microscope
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