Microswitch testing device

Microswitch testing device

The application, which belongs to the technical field of testing devices, relates to a microswitch testing device comprising a fixed clamp provided with a first positioning mechanism for locating andfixing a microswitch, a machine bench, a touch pressing mechanism, and a controller. A second positio...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LUO XINGTAO, LIU SHUANG, LING YONG, ZHAO BO, LIAO XINGQING, KANG YANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator LUO XINGTAO
LIU SHUANG
LING YONG
ZHAO BO
LIAO XINGQING
KANG YANG
description The application, which belongs to the technical field of testing devices, relates to a microswitch testing device comprising a fixed clamp provided with a first positioning mechanism for locating andfixing a microswitch, a machine bench, a touch pressing mechanism, and a controller. A second positioning mechanism for locating and fixing the fixed clamp is formed on the machine bench; and the fixed clamp is located and installed in the second positioning mechanism detachably. The touch pressing mechanism installed at the machine bench is used for making reciprocating motion and performing onetouch pressing action on an action reed of the microswitch located and fixed in the first positioning mechanism in the reciprocating motion every time to enable the microswitch to perform conduction action once. The controller is used for controlling the touch pressing mechanism to repeatedly execute the touch pressing action. According to the application, repeated on-off action tests can be carried out on microswitches wi
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN110501635A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN110501635A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN110501635A3</originalsourceid><addsrcrecordid>eNrjZJDyzUwuyi8uzyxJzlAoSS0uycxLV0hJLctMTuVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGBqYGhmbGpo7GxKgBAGCqIyc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Microswitch testing device</title><source>esp@cenet</source><creator>LUO XINGTAO ; LIU SHUANG ; LING YONG ; ZHAO BO ; LIAO XINGQING ; KANG YANG</creator><creatorcontrib>LUO XINGTAO ; LIU SHUANG ; LING YONG ; ZHAO BO ; LIAO XINGQING ; KANG YANG</creatorcontrib><description>The application, which belongs to the technical field of testing devices, relates to a microswitch testing device comprising a fixed clamp provided with a first positioning mechanism for locating andfixing a microswitch, a machine bench, a touch pressing mechanism, and a controller. A second positioning mechanism for locating and fixing the fixed clamp is formed on the machine bench; and the fixed clamp is located and installed in the second positioning mechanism detachably. The touch pressing mechanism installed at the machine bench is used for making reciprocating motion and performing onetouch pressing action on an action reed of the microswitch located and fixed in the first positioning mechanism in the reciprocating motion every time to enable the microswitch to perform conduction action once. The controller is used for controlling the touch pressing mechanism to repeatedly execute the touch pressing action. According to the application, repeated on-off action tests can be carried out on microswitches wi</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20191126&amp;DB=EPODOC&amp;CC=CN&amp;NR=110501635A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20191126&amp;DB=EPODOC&amp;CC=CN&amp;NR=110501635A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LUO XINGTAO</creatorcontrib><creatorcontrib>LIU SHUANG</creatorcontrib><creatorcontrib>LING YONG</creatorcontrib><creatorcontrib>ZHAO BO</creatorcontrib><creatorcontrib>LIAO XINGQING</creatorcontrib><creatorcontrib>KANG YANG</creatorcontrib><title>Microswitch testing device</title><description>The application, which belongs to the technical field of testing devices, relates to a microswitch testing device comprising a fixed clamp provided with a first positioning mechanism for locating andfixing a microswitch, a machine bench, a touch pressing mechanism, and a controller. A second positioning mechanism for locating and fixing the fixed clamp is formed on the machine bench; and the fixed clamp is located and installed in the second positioning mechanism detachably. The touch pressing mechanism installed at the machine bench is used for making reciprocating motion and performing onetouch pressing action on an action reed of the microswitch located and fixed in the first positioning mechanism in the reciprocating motion every time to enable the microswitch to perform conduction action once. The controller is used for controlling the touch pressing mechanism to repeatedly execute the touch pressing action. According to the application, repeated on-off action tests can be carried out on microswitches wi</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJDyzUwuyi8uzyxJzlAoSS0uycxLV0hJLctMTuVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGBqYGhmbGpo7GxKgBAGCqIyc</recordid><startdate>20191126</startdate><enddate>20191126</enddate><creator>LUO XINGTAO</creator><creator>LIU SHUANG</creator><creator>LING YONG</creator><creator>ZHAO BO</creator><creator>LIAO XINGQING</creator><creator>KANG YANG</creator><scope>EVB</scope></search><sort><creationdate>20191126</creationdate><title>Microswitch testing device</title><author>LUO XINGTAO ; LIU SHUANG ; LING YONG ; ZHAO BO ; LIAO XINGQING ; KANG YANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN110501635A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2019</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LUO XINGTAO</creatorcontrib><creatorcontrib>LIU SHUANG</creatorcontrib><creatorcontrib>LING YONG</creatorcontrib><creatorcontrib>ZHAO BO</creatorcontrib><creatorcontrib>LIAO XINGQING</creatorcontrib><creatorcontrib>KANG YANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LUO XINGTAO</au><au>LIU SHUANG</au><au>LING YONG</au><au>ZHAO BO</au><au>LIAO XINGQING</au><au>KANG YANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Microswitch testing device</title><date>2019-11-26</date><risdate>2019</risdate><abstract>The application, which belongs to the technical field of testing devices, relates to a microswitch testing device comprising a fixed clamp provided with a first positioning mechanism for locating andfixing a microswitch, a machine bench, a touch pressing mechanism, and a controller. A second positioning mechanism for locating and fixing the fixed clamp is formed on the machine bench; and the fixed clamp is located and installed in the second positioning mechanism detachably. The touch pressing mechanism installed at the machine bench is used for making reciprocating motion and performing onetouch pressing action on an action reed of the microswitch located and fixed in the first positioning mechanism in the reciprocating motion every time to enable the microswitch to perform conduction action once. The controller is used for controlling the touch pressing mechanism to repeatedly execute the touch pressing action. According to the application, repeated on-off action tests can be carried out on microswitches wi</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_CN110501635A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Microswitch testing device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T00%3A12%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LUO%20XINGTAO&rft.date=2019-11-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN110501635A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true