MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM
This measuring device includes: an irradiation unit that diagonally irradiates a surface with light; a detection unit that detects the intensity distribution of reflection light from the surface; a processing unit that obtains a two-dimensional bidirectional reflectance distribution function (BRDF)...
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| creator | KUROKI YUKIE |
| description | This measuring device includes: an irradiation unit that diagonally irradiates a surface with light; a detection unit that detects the intensity distribution of reflection light from the surface; a processing unit that obtains a two-dimensional bidirectional reflectance distribution function (BRDF) of the surface on the basis of the intensity distribution; and a display unit that displays the BRDFthus obtained by the processing unit. The detection unit detects the intensity distribution within a direction range, which includes first direction, i.e., the direction of regular reflection light from the surface, and which does not include the direction that forms, with the first direction, an angle equal to or larger than the angle formed between the first direction and second direction orthogonal to the surface.
本发明提供一种测量装置，其特征在于，所述测量装置包括：照射单元，被配置为用光倾斜地照射表面；检测单元，被配置为检测来自所述表面的反射光的强度分布；处理单元，被配置为基于强度分布获得所述表面的二维BRDF；以及显示单元，被配置为显示由处理单元获得的BRDF，其中，检测单元检测在方向范围内的强度分布，该方向范围包括作为来自表面的镜面反射光的方向的第一方向，并且不包括与第一方向一起限定的角度不小于由第一方向和 |
| format | Patent |
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本发明提供一种测量装置，其特征在于，所述测量装置包括：照射单元，被配置为用光倾斜地照射表面；检测单元，被配置为检测来自所述表面的反射光的强度分布；处理单元，被配置为基于强度分布获得所述表面的二维BRDF；以及显示单元，被配置为显示由处理单元获得的BRDF，其中，检测单元检测在方向范围内的强度分布，该方向范围包括作为来自表面的镜面反射光的方向的第一方向，并且不包括与第一方向一起限定的角度不小于由第一方向和</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190830&DB=EPODOC&CC=CN&NR=110192099A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190830&DB=EPODOC&CC=CN&NR=110192099A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KUROKI YUKIE</creatorcontrib><title>MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM</title><description>This measuring device includes: an irradiation unit that diagonally irradiates a surface with light; a detection unit that detects the intensity distribution of reflection light from the surface; a processing unit that obtains a two-dimensional bidirectional reflectance distribution function (BRDF) of the surface on the basis of the intensity distribution; and a display unit that displays the BRDFthus obtained by the processing unit. The detection unit detects the intensity distribution within a direction range, which includes first direction, i.e., the direction of regular reflection light from the surface, and which does not include the direction that forms, with the first direction, an angle equal to or larger than the angle formed between the first direction and second direction orthogonal to the surface.
本发明提供一种测量装置，其特征在于，所述测量装置包括：照射单元，被配置为用光倾斜地照射表面；检测单元，被配置为检测来自所述表面的反射光的强度分布；处理单元，被配置为基于强度分布获得所述表面的二维BRDF；以及显示单元，被配置为显示由处理单元获得的BRDF，其中，检测单元检测在方向范围内的强度分布，该方向范围包括作为来自表面的镜面反射光的方向的第一方向，并且不包括与第一方向一起限定的角度不小于由第一方向和</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIj2dXUMDg3y9HNXcHEN83R21VHw9HPzD_J1DPH091MICPJ3dg0OJkLa1zXEw99FR8HRzwUk7B7k6MvDwJqWmFOcyguluRkU3VxDnD10Uwvy41OLCxKTU_NSS-Kd_QwNDQwtjQwsLR2NiVEDAJXMMiM</recordid><startdate>20190830</startdate><enddate>20190830</enddate><creator>KUROKI YUKIE</creator><scope>EVB</scope></search><sort><creationdate>20190830</creationdate><title>MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM</title><author>KUROKI YUKIE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN110192099A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2019</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KUROKI YUKIE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KUROKI YUKIE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM</title><date>2019-08-30</date><risdate>2019</risdate><abstract>This measuring device includes: an irradiation unit that diagonally irradiates a surface with light; a detection unit that detects the intensity distribution of reflection light from the surface; a processing unit that obtains a two-dimensional bidirectional reflectance distribution function (BRDF) of the surface on the basis of the intensity distribution; and a display unit that displays the BRDFthus obtained by the processing unit. The detection unit detects the intensity distribution within a direction range, which includes first direction, i.e., the direction of regular reflection light from the surface, and which does not include the direction that forms, with the first direction, an angle equal to or larger than the angle formed between the first direction and second direction orthogonal to the surface.
本发明提供一种测量装置，其特征在于，所述测量装置包括：照射单元，被配置为用光倾斜地照射表面；检测单元，被配置为检测来自所述表面的反射光的强度分布；处理单元，被配置为基于强度分布获得所述表面的二维BRDF；以及显示单元，被配置为显示由处理单元获得的BRDF，其中，检测单元检测在方向范围内的强度分布，该方向范围包括作为来自表面的镜面反射光的方向的第一方向，并且不包括与第一方向一起限定的角度不小于由第一方向和</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM |
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