Fine particle sample introduction device, and sampling system and method for aircraft aerial survey

The present invention discloses a fine particle sample introduction device, and sampling system and method for the aircraft aerial survey, which solves the problem of many modifications to the aircraft due to that gas sampling has serious sample loss in the prior art, and has the beneficial effects...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHEN TIANSHU, WANG XINFENG, SHAN YE, XUE LIKUN, LI HONGYONG, WEN LIANG, MOU JIANGSHAN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!