Method for measuring elevation of independent structure
The invention discloses a method for measuring the elevation of an independent structure, which comprises the following steps: selecting two survey stations, which are in communication with a to-be-measured point and are positioned on the same vertical plane, on the ground far away from the structur...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | chi ; eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | LIU SINONG LIAO HONGYU WANG JUN HE HONGLING LIU MINGZHOU WEI MIN |
| description | The invention discloses a method for measuring the elevation of an independent structure, which comprises the following steps: selecting two survey stations, which are in communication with a to-be-measured point and are positioned on the same vertical plane, on the ground far away from the structure to be measured according to the angle measurement and distance measurement integrated function ofa total station and the advantages and characteristics of accurate data and convenience in operation of the total station and by combining a certain mathematical theory; erecting the total station atthe two survey stations respectively; observing two vertical angles and a section of horizontal distance; calculating the height difference between the top end of the structure to be measured and thesurvey stations through mathematical calculation; and obtaining the accurate elevation of the independent structure conveniently and quickly through the relationship between known points on the groundand the survey stations. Th |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_CN110118546A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>CN110118546A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_CN110118546A3</originalsourceid><addsrcrecordid>eNrjZDD3TS3JyE9RSMsvUshNTSwuLcrMS1dIzUktSyzJzM9TyE9TyMxLSS1IBRJ5JQrFJUWlySWlRak8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTe2c_Q0MDQ0MLUxMzRmBg1AAK0LmI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for measuring elevation of independent structure</title><source>esp@cenet</source><creator>LIU SINONG ; LIAO HONGYU ; WANG JUN ; HE HONGLING ; LIU MINGZHOU ; WEI MIN</creator><creatorcontrib>LIU SINONG ; LIAO HONGYU ; WANG JUN ; HE HONGLING ; LIU MINGZHOU ; WEI MIN</creatorcontrib><description>The invention discloses a method for measuring the elevation of an independent structure, which comprises the following steps: selecting two survey stations, which are in communication with a to-be-measured point and are positioned on the same vertical plane, on the ground far away from the structure to be measured according to the angle measurement and distance measurement integrated function ofa total station and the advantages and characteristics of accurate data and convenience in operation of the total station and by combining a certain mathematical theory; erecting the total station atthe two survey stations respectively; observing two vertical angles and a section of horizontal distance; calculating the height difference between the top end of the structure to be measured and thesurvey stations through mathematical calculation; and obtaining the accurate elevation of the independent structure conveniently and quickly through the relationship between known points on the groundand the survey stations. Th</description><language>chi ; eng</language><subject>GYROSCOPIC INSTRUMENTS ; MEASURING ; MEASURING DISTANCES, LEVELS OR BEARINGS ; NAVIGATION ; PHOTOGRAMMETRY OR VIDEOGRAMMETRY ; PHYSICS ; SURVEYING ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190813&DB=EPODOC&CC=CN&NR=110118546A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190813&DB=EPODOC&CC=CN&NR=110118546A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIU SINONG</creatorcontrib><creatorcontrib>LIAO HONGYU</creatorcontrib><creatorcontrib>WANG JUN</creatorcontrib><creatorcontrib>HE HONGLING</creatorcontrib><creatorcontrib>LIU MINGZHOU</creatorcontrib><creatorcontrib>WEI MIN</creatorcontrib><title>Method for measuring elevation of independent structure</title><description>The invention discloses a method for measuring the elevation of an independent structure, which comprises the following steps: selecting two survey stations, which are in communication with a to-be-measured point and are positioned on the same vertical plane, on the ground far away from the structure to be measured according to the angle measurement and distance measurement integrated function ofa total station and the advantages and characteristics of accurate data and convenience in operation of the total station and by combining a certain mathematical theory; erecting the total station atthe two survey stations respectively; observing two vertical angles and a section of horizontal distance; calculating the height difference between the top end of the structure to be measured and thesurvey stations through mathematical calculation; and obtaining the accurate elevation of the independent structure conveniently and quickly through the relationship between known points on the groundand the survey stations. Th</description><subject>GYROSCOPIC INSTRUMENTS</subject><subject>MEASURING</subject><subject>MEASURING DISTANCES, LEVELS OR BEARINGS</subject><subject>NAVIGATION</subject><subject>PHOTOGRAMMETRY OR VIDEOGRAMMETRY</subject><subject>PHYSICS</subject><subject>SURVEYING</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD3TS3JyE9RSMsvUshNTSwuLcrMS1dIzUktSyzJzM9TyE9TyMxLSS1IBRJ5JQrFJUWlySWlRak8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uCAxOTUvtSTe2c_Q0MDQ0MLUxMzRmBg1AAK0LmI</recordid><startdate>20190813</startdate><enddate>20190813</enddate><creator>LIU SINONG</creator><creator>LIAO HONGYU</creator><creator>WANG JUN</creator><creator>HE HONGLING</creator><creator>LIU MINGZHOU</creator><creator>WEI MIN</creator><scope>EVB</scope></search><sort><creationdate>20190813</creationdate><title>Method for measuring elevation of independent structure</title><author>LIU SINONG ; LIAO HONGYU ; WANG JUN ; HE HONGLING ; LIU MINGZHOU ; WEI MIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN110118546A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2019</creationdate><topic>GYROSCOPIC INSTRUMENTS</topic><topic>MEASURING</topic><topic>MEASURING DISTANCES, LEVELS OR BEARINGS</topic><topic>NAVIGATION</topic><topic>PHOTOGRAMMETRY OR VIDEOGRAMMETRY</topic><topic>PHYSICS</topic><topic>SURVEYING</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LIU SINONG</creatorcontrib><creatorcontrib>LIAO HONGYU</creatorcontrib><creatorcontrib>WANG JUN</creatorcontrib><creatorcontrib>HE HONGLING</creatorcontrib><creatorcontrib>LIU MINGZHOU</creatorcontrib><creatorcontrib>WEI MIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIU SINONG</au><au>LIAO HONGYU</au><au>WANG JUN</au><au>HE HONGLING</au><au>LIU MINGZHOU</au><au>WEI MIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for measuring elevation of independent structure</title><date>2019-08-13</date><risdate>2019</risdate><abstract>The invention discloses a method for measuring the elevation of an independent structure, which comprises the following steps: selecting two survey stations, which are in communication with a to-be-measured point and are positioned on the same vertical plane, on the ground far away from the structure to be measured according to the angle measurement and distance measurement integrated function ofa total station and the advantages and characteristics of accurate data and convenience in operation of the total station and by combining a certain mathematical theory; erecting the total station atthe two survey stations respectively; observing two vertical angles and a section of horizontal distance; calculating the height difference between the top end of the structure to be measured and thesurvey stations through mathematical calculation; and obtaining the accurate elevation of the independent structure conveniently and quickly through the relationship between known points on the groundand the survey stations. Th</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | chi ; eng |
| recordid | cdi_epo_espacenet_CN110118546A |
| source | esp@cenet |
| subjects | GYROSCOPIC INSTRUMENTS MEASURING MEASURING DISTANCES, LEVELS OR BEARINGS NAVIGATION PHOTOGRAMMETRY OR VIDEOGRAMMETRY PHYSICS SURVEYING TESTING |
| title | Method for measuring elevation of independent structure |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T05%3A42%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LIU%20SINONG&rft.date=2019-08-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ECN110118546A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |