Failure analysis method and device, equipment and storage medium

The invention relates to a failure analysis method and device, computer equipment and a storage medium. The computer equipment obtains at least one test data of a to-be-tested failure device; the testdata is input into a deep learning model for failure analysis processing, and failure node informati...

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Bibliographische Detailangaben
Hauptverfasser: PENG ZEYA, ZHAO ZHENBO, LIU LIYUAN, WANG HONGJIAN, WANG YOULIANG
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention relates to a failure analysis method and device, computer equipment and a storage medium. The computer equipment obtains at least one test data of a to-be-tested failure device; the testdata is input into a deep learning model for failure analysis processing, and failure node information associated with each test data is obtained; wherein the failure node information comprises an upper-level failure event node and a lower-level failure event node which are associated with the test data, and the lower-level failure event node is an alternative failure mechanism of the upper-levelfailure event node; And finally, according to the failure node information associated with each test data, constructing a father-child relationship among the failure event nodes, and according to thefather-child relationship, determining the bottommost failure event node as a target failure mechanism of the to-be-tested failure device. By adopting the method, the failure analysis efficiency andaccuracy can be improved. 本申